R&S FS-K112PC NFC Measurement Software Specifications

Transcription

1 FS_K112-PC_dat-sw_ _cover.indd 1 Data Sheet Test & Measurement R&S FS-K112PC NFC Measurement Software Specifications :19:15

2 CONTENTS Definitions... 3 Specifications... 4 Minimum system requirements for R&S FS-K112PC software... 4 Running on a PC... 4 Measurement parameters... 4 Result display... 4 General results... 4 NFC-A specific results... 4 NFC-B specific results... 5 NFC-F specific results... 5 R&S FSL/ZVL/FSV/FSW... 6 Frequency... 6 Level... 6 Signal acquisition... 6 R&S RTO input source... 6 Frequency... 6 Level... 6 Signal acquisition... 6 R&S FSV/FSL/FSW measurement uncertainty (nominal)... 7 NFC-A specific parameters... 7 NFC-B specific parameters... 7 NFC-F 212kB specific parameters... 7 NFC-F 424kB specific parameters... 7 R&S ZVL measurement uncertainty (nominal)... 8 NFC-A specific parameters... 8 NFC-B specific parameters... 8 NFC-F 212kB specific parameters... 8 NFC-F 424kB specific parameters... 8 R&S RTO measurement uncertainty (nominal)... 9 NFC-A specific parameters... 9 NFC-B specific parameters... 9 NFC-F 212kB specific parameters... 9 NFC-F 424kB specific parameters... 9 Ordering information The specifications of the R&S FS-K112PC NFC Measurement Software are based on the data sheet specifications of the R&S FSV, R&S FSW and R&S FSL signal and spectrum analyzers, the R&S ZVLvector network analyzer and the R&S RTO digital oscilloscope, have not been checked separately and are not verified during instrument calibration. Measurement uncertainties are given as 95 % confidence intervals. The specified level measurement errors do not take into account systematic errors due to reduced signal to noise ratio (S/N). Chip rates are specified in Mcps (million chips per second), whereas bit rates and symbol rates are specified in kbps (thousand bits per second) or ksps (thousand symbols per second). Mcps, kbps and ksps are not SI units. 2 Rohde & Schwarz R&S FS-K112PC NFC Measurement Software

3 Definitions General Product data applies under the following conditions: Three hours storage at ambient temperature followed by 30 minutes warm-up operation Specified environmental conditions met Recommended calibration interval adhered to All internal automatic adjustments performed, if applicable Specifications with limits Represent warranted product performance by means of a range of values for the specified parameter. These specifications are marked with limiting symbols such as <,, >,, ±, or descriptions such as maximum, limit of, minimum. Compliance is ensured by testing or is derived from the design. Test limits are narrowed by guard bands to take into account measurement uncertainties, drift and aging, if applicable. Specifications without limits Represent warranted product performance for the specified parameter. These specifications are not specially marked and represent values with no or negligible deviations from the given value (e.g. dimensions or resolution of a setting parameter). Compliance is ensured by design. Typical data (typ.) Characterizes product performance by means of representative information for the given parameter. When marked with <, > or as a range, it represents the performance met by approximately 80 % of the instruments at production time. Otherwise, it represents the mean value. Nominal values (nom.) Characterize product performance by means of a representative value for the given parameter (e.g. nominal impedance). In contrast to typical data, a statistical evaluation does not take place and the parameter is not tested during production. Measured values (meas.) Characterize expected product performance by means of measurement results gained from individual samples. Uncertainties Represent limits of measurement uncertainty for a given measurand. Uncertainty is defined with a coverage factor of 2 and has been calculated in line with the rules of the Guide to the Expression of Uncertainty in Measurement (GUM), taking into account environmental conditions, aging, wear and tear. Device settings and GUI parameters are designated with the format parameter: value. Typical data as well as nominal and measured values are not warranted by Rohde & Schwarz. Rohde & Schwarz R&S FS-K112PC NFC Measurement Software 3

4 Specifications Minimum system requirements for R&S FS-K112PC software The R&S FS-K112PC software is compatible with the R&S FSV/FSL/ZVL/FSW signal and spectrum analyzers and the R&S RTO digital oscilloscope. Running on a PC Operating system Windows XP Professional + Service Pack 2, Windows 7 Free hard disk space 50 Mbyte Free RAM 512 Mbyte Graphics resolution pixel Measuring instrument connection IEC/IEEE bus or LAN connection, VISA driver Measurement parameters Input Supported NFC modulations Supported NFC bitrates NFC reference poller used for listener tests Peak to RMS factor RF NFC-A, NFC-B, NFC-F 106 kbit/s, 212 kbit/s, 424 kbit/s poller 0, poller 3, poller 6 Result display General results Result overview Analyzed standard Analyzed bitrate Poller RF state Listener RF state Functional test state Number of detected poller signals (NFC-A, NFC-B and NFC-F) Decoding Detected poller commands Detected listener commands NFC-A specific results Poller values Unit t 1 µs t 2 µs t 3 µs t 4 µs t 5 µs Overshoot V O, A % Amplitude shift keying modulation depth % Listener values Load modulation mv Frame delay time listener (only available if a listener answer has been detected) µs Frame delay time poller µs (only available if the poller answered to the listener s SENS RES command) Offtime t off µs 4 Rohde & Schwarz R&S FS-K112PC NFC Measurement Software

5 NFC-B specific results Poller values Unit Fall time t f, B µs Rise time t r, B µs Overshoot V O,B % Undershoot V U, B % Modulation index m i, B % Listener values Load modulation mv Frame delay time listener (only available if a listener answer has been detected) µs Frame delay time poller µs (only available if the poller answered to the Listener s SENS RES command) Offtime t off µs NFC-F specific results Poller values Unit Fall time t f, F µs Rise time t r, F µs Overshoot V O, F % Undershoot V U, F % Modulation index m i, F % Listener values Load modulation mv Frame delay time listener (only available if a listener answer has been detected) µs Frame delay time poller µs (only available if the poller answered to the listener s SENS RES command) Offtime t off µs Rohde & Schwarz R&S FS-K112PC NFC Measurement Software 5

6 R&S FSL/ZVL/FSV/FSW Frequency Center frequency range 13.0 MHz to 14.0 MHz Level Level range RF input 50 dbm to +30 dbm Signal acquisition Capture length R&S FSL/ZVL 0.05 ms to 25 ms R&S FSV/FSW 0.05 ms to 100 ms Sample rate 5 MHz to 20 MHz Trigger modes RF input free run, external, IF power Coupling 50 Ω R&S RTO input source Frequency Center frequency range 13.0 MHz to 14.0 MHz Level Level range RF input 50 dbm to +30 dbm Signal acquisition Capture length 0.05 ms to 100 ms Sample rate 5 MHz to 20 MHz Trigger modes RF input free run, external, poller SENS REQ trigger for NFC-A, NFC-B, NFC-F212 and NFC-F424 Input channel channel 1, channel 2, channel 3, channel 4 Coupling 50 Ω or 1000 Ω 6 Rohde & Schwarz R&S FS-K112PC NFC Measurement Software

7 R&S FSV/FSL/FSW measurement uncertainty (nominal) The measurement uncertainty has been measured by connecting the RF output of a vector signal generator directly to the RF input of the R&S FSx. The signal generator has been configured to use a carrier frequency of MHz and an output level of 10 dbm. The measurements have been triggered by using an external trigger signal which was supplied by the marker output of the generator. A sample rate of 20 MHz has been used for the measurements. NFC-A specific parameters t 1 µs < 0.09 < 2/f carrier 0.14 for f carrier = MHz t 2 µs < 0.09 < 2/f carrier 0.14 for f carrier = MHz t 3 µs < 0.03 < 2/f carrier 0.14 for f carrier = MHz t 4 µs < 0.03 < 2/f carrier 0.14 for f carrier = MHz V O, A % < 0.5 < 0.5 NFC-B specific parameters t r, B µs < 0.09 < 2/f carrier 0.14 for f carrier = MHz t f, B µs < 0.09 < 2/f carrier 0.14 for f carrier = MHz V O, B % < 0.5 < 0.5 V U, B % < 0.5 < 0.5 m i, B % < 0.5 < 0.5 valid for modulation NFC-F 212kB specific parameters t r, F µs < 0.13 < 2/f carrier 0.14 for f carrier = MHz t f, F µs < 0.13 < 2/f carrier 0.14 for f carrier = MHz V O, F % < 0.5 < 0.5 V U, F % < 0.5 < 0.5 m i, F % < 0.5 < 0.5 valid for modulation NFC-F 424kB specific parameters t r, F µs < 0.13 < 2/f carrier 0.14 for f carrier = MHz t f, F µs < 0.13 < 2/f carrier 0.14 for f carrier = MHz V O, F % < 0.5 < 0.5 V U, F % < 0.5 < 0.5 m i, F % < 0.5 < 0.5 valid for modulation Rohde & Schwarz R&S FS-K112PC NFC Measurement Software 7

8 R&S ZVL measurement uncertainty (nominal) The measurement uncertainty has been measured by connecting the RF output of a vector signal generator directly to the RF input of the R&S ZVL. The signal generator has been configured to use a carrier frequency of MHz and an output level of 10 dbm. The measurements have been triggered by using an external trigger signal which was supplied by the marker output of the generator. For the R&S ZVL measurements a sampling rate of 16.5 MHz has been used. NFC-A specific parameters t 1 µs < 0.09 < 2/f carrier 0.14 for f carrier = MHz t 2 µs < 0.09 < 2/f carrier 0.14 for f carrier = MHz t 3 µs < 0.03 < 2/f carrier 0.14 for f carrier = MHz t 4 µs < 0.03 < 2/f carrier 0.14 for f carrier = MHz V O, A % < 0.5 < 0.5 NFC-B specific parameters t r, B µs < 0.09 < 2/f carrier 0.14 for f carrier = MHz t f, B µs < 0.09 < 2/f carrier 0.14 for f carrier = MHz V O, B % < 0.5 < 0.5 V U, B % < 0.5 < 0.5 m i, B % < 1.4 < 0.5 valid for modulation NFC-F 212kB specific parameters t r, F µs < 0.13 < 2/f carrier 0.14 for f carrier = MHz t f, F µs < 0.13 < 2/f carrier 0.14 for f carrier = MHz V O, F % < 0.5 < 0.5 V U, F % < 0.5 < 0.5 m i, F % < 1.4 < 0.5 valid for modulation NFC-F 424kB specific parameters t r, F µs < 0.13 < 2/f carrier 0.14 for f carrier = MHz t f, F µs < 0.13 < 2/f carrier 0.14 for f carrier = MHz V O, F % < 0.5 < 0.5 V U, F % < 0.5 < 0.5 m i, F % < 1.4 < 0.5 valid for modulation 8 Rohde & Schwarz R&S FS-K112PC NFC Measurement Software

9 R&S RTO measurement uncertainty (nominal) The measurement uncertainty has been measured by connecting the RF output of a vector signal generator directly to the CH1 input of the R&S RTO. The signal generator has been configured to use a carrier frequency of MHz and an output level of 10 dbm. The measurements have been triggered by using an external trigger signal which was supplied by the marker output of the generator. A sample rate of 20 MHz has been used for the measurements. NFC-A specific parameters t 1 µs < 0.09 < 2/f carrier 0.14 for f carrier = MHz t 2 µs < 0.09 < 2/f carrier 0.14 for f carrier = MHz t 3 µs < 0.03 < 2/f carrier 0.14 for f carrier = MHz t 4 µs < 0.03 < 2/f carrier 0.14 for f carrier = MHz V O, A % < 0.5 < 0.5 NFC-B specific parameters t r, B µs < 0.09 < 2/f carrier 0.14 for f carrier = MHz t f, B µs < 0.09 < 2/f carrier 0.14 for f carrier = MHz V O, B % < 0.5 < 0.5 V U, B % < 0.5 < 0.5 m i, B % < 0.5 < 0.5 valid for modulation NFC-F 212kB specific parameters t r, F µs < 0.09 < 2/f carrier 0.14 for f carrier = MHz t f, F µs < 0.09 < 2/f carrier 0.14 for f carrier = MHz V O, F % < 0.5 < 0.5 V U, F % < 0.5 < 0.5 m i, F % < 0.5 < 0.5 valid for modulation NFC-F 424kB specific parameters t r, F µs < 0.09 < 2/f carrier 0.14 for f carrier = MHz t f, F µs < 0.09 < 2/f carrier 0.14 for f carrier = MHz V O, F % < 0.5 < 0.5 V U, F % < 0.5 < 0.5 m i, F % < 0.5 < 0.5 valid for modulation Rohde & Schwarz R&S FS-K112PC NFC Measurement Software 9

10 Ordering information Designation Type Order No. NFC Measurement Software R&S FS-K112PC License Dongle R&S FSPC Signal and Spectrum Analyzer R&S FSV Signal and Spectrum Analyzer R&S FSW K08 Vector Network Analyzer R&S ZVL Spectrum Analyzer R&S FSL Kxx Digital Oscilloscope R&S RTO xx with R&S RTO-K11 option An R&S FSPC license dongle is necessary to run the R&S FS-K112PC NFC measurement software. Existing license dongles can be used. References [1] NFC Analogue Specification Technical Specification, NFC Forum TM, Analog1.0, NFC Forum-TS-Analog-v1.0, [2] Test Cases for NFC RF Analogue Specification NFC Forum TM, ANALOGUE_TC , NFC Forum_TestCases for Analogue, , CONFIDENTIAL DRAFT. For product brochure, see PD and 10 Rohde & Schwarz R&S FS-K112PC NFC Measurement Software

11 Rohde & Schwarz R&S FS-K112PC NFC Measurement Software 11

12 Service that adds value Worldwide Local and personalized Customized and flexible Uncompromising quality Long-term dependability About Rohde & Schwarz The Rohde & Schwarz electronics group is a leading supplier of solutions in the fields of test and measurement, broadcasting, secure communications, and radiomonitor ing and radiolocation. Founded more than 80 years ago, this independent global company has an extensive sales network and is present in more than 70 countries. The company is headquartered in Munich, Germany. Sustainable product design Environmental compatibility and eco-footprint Energy efficiency and low emissions Longevity and optimized total cost of ownership Certified Quality Management ISO 9001 Certified Environmental Management ISO Rohde & Schwarz GmbH & Co. KG R&S is a registered trademark of Rohde & Schwarz GmbH & Co. KG Trade names are trademarks of the owners PD PD Version October 2014 (as) R&S FS-K112PC NFC Measurement Software Data without tolerance limits is not binding Subject to change Rohde & Schwarz GmbH & Co. KG Munich, Germany PD PDP 1 en Regional contact Europe, Africa, Middle East customersupport@rohde-schwarz.com North America TEST RSA ( ) customer.support@rsa.rohde-schwarz.com Latin America customersupport.la@rohde-schwarz.com Asia Pacific customersupport.asia@rohde-schwarz.com China customersupport.china@rohde-schwarz.com FS_K112-PC_dat-sw_ _cover.indd :19:15