Instructions for Tecnai a brief start up manual

Size: px
Start display at page:

Download "Instructions for Tecnai a brief start up manual"

Transcription

1 Instructions for Tecnai a brief start up manual Version 3.0, Manual of Tecnai 12 transmission electron microscope located at Aalto University's Nanomicroscopy Center. More information of Nanomicroscopy Center at 1. Start up procedure 1. Turn ON monitors 2. Login: Ctrl+Alt+Del; Username: user; Password: Tecnai 3. Open and fill user s log 4. Open Gatan Digital Micrograph software and Tecnai User Interface software 5. Check that the window glass of the viewing chamber is protected by the black rubber disk 6. Fill the cold-trap liquid nitrogen dewar. If the 35L dewar is empty, fill it from the 230L dewar near the service corridor. 7. Check that High tension is ON i.e. the button is yellow. (If the button is grey with a black text, simply click it; if the button is grey with a grey text, in that case push high voltage on from the HT button on the panel close to the camera chamber) 8. Switch on the filament; heating takes ca. 4 8 minutes 9. Now the microscope is ready for operation. IF YOU ARE NOT ABSOLUTELY SURE HOW TO REMOVE OR INSERT THE SAMPLE HOLDER, READ CAREFULLY THE FOLLOWING INSTRUCTIONS!!! 1

2 2. Shut down procedure 1. Lower the fluorescent screen 2. If you were using nanoprobe, diffraction, HV other than 120kV, dark field etc. put the microscope back to standard operation mode and check that it is properly aligned in normal mode (standard operation mode = microprobe, 120kV, bright field) 3. Set the magnification to Spread the illumination so that it roughly fully covers the whole screen using the Intensity button on the panel, turn clockwise 5. Reset the holder (from workset Search Stage Control Reset Holder) 6. Take out the objective aperture (and also selected area aperture if used) 7. Filament OFF (Setup click Filament) 8. Close column valves 9. Cover the viewing chamber glass with the black rubber disk 10. Take sample holder out and remove your samples out from the holder 11. Put empty sample holder back into the microscope 12. If the next user is coming (for sure) within 4 hours add more liquid nitrogen to the cold trap Otherwise: Remove the dewar and start the cryo cycle (check settings: start after 1 min and duration 120 min). (Vacuum Cryo Cryo cycle) 13. Close the Tecnai user interface and (save settings) and close Gatan Digital Micrograph software 14. Fill the log 15. Log out 16. Turn off the monitors 17. CLEAN the tables etc. 2

3 3. Sample holders Goniometer (the place where the sample holder is in the microscope) and the sample holder itself are almost the only things which get broken quite easily therefore handle holders with some care they are also expensive: the standard holder is ca and the cryo holder is ca If you are not absolutely sure how to insert the sample holder, watch the demo movie and/or ask for help Do not touch holders with your bare hands. USE GLOVES! The grease from your fingers will contaminate the microscope vacuum system and also cause sample drifting. Do not touch the area between the o-ring and the tip even with the gloves How to remove holder from microscope 1. Check that the column valves are closed 2. Workset Setup vacuum Col. Valves closed button (this button should be yellow when valve is closed) 3. Holder can be removed during the filament heating and also when Filament is ON In practise 1. First pull the holder backwards until it stops at the same time by leaning with your fingers towards the blue disk 2. Then rotate the holder clockwise without pulling (IMPORTANT!!!) anymore 3. Then by leaning with your fingers towards the goniometer hold on to the holder and carefully push (IMPORTANT!!!) holder with your fingers backwards, because at this stage the airlock vacuum will give up and the holder will be released. Do not pull the holder out pulling will cause holder to move suddenly very fast and this may break the holder and/or goniometer Do not use too much force, it will only break things. Do not hesitate, i.e. use continuous movement 3

4 3.3. How insert a holder into microscope If you are not absolutely sure how to insert the sample holder, watch the demo movie and/or ask for help 1. Open vacuum overview window before you insert the sample holder to the microscope 2. Insert the sample holder so that the pin in the holder is directed with the 5 o clock line in goniometer and push the holder to the airlock. When you feel that the holder touches the cylinder inside the goniometer, it still may move inwards about 1.5 cm. 3. Then make sure that the vacuum pump starts to pump the airlock > red light will go on in the goniometer > See the vacuum overview window valve V8 should open about after 5 60 seconds. > Also make sure that the airlock vacuum level is really getting better (observe the decreasing pressure P2 vacuum gauge; vacuum overview window). The pump should run 40 seconds after the opening of valve V8, you can see the remaining time at the vacuum overview window. > If the countdown doesn t start or if the vacuum level won t get better, take the sample holder out and try again. 4. The red light goes out when the airlock is pumped and V8 closes. Then immediately rotate the holder counter clockwise until the vacuum starts to suck the holder in. When the vacuum starts to suck the holder in, hold it back so that it does not move too fast. > Note: (Red light does not go out if holder type is not selected if asked, however at the moment setting should be so that holder selection is not needed). 5. Cover the viewing chamber window with black rubber disk and add more liquid nitrogen to the cold trap if necessary 6. Gun/Col vacuum reading should be below 25 and then you can open column valves (and remove the window cover) and microscope should be ready TIPS: Vacuum with the holder will reach normally 6, below 25 is safe If the vacuum crashes: stop and start the vacuum again using the Vac push button on the right side of the camera chamber (i.e. you have to press button twice) 4

5 4. Inserting grids to four place specimen holder Do not touch holders with your bare hands USE GLOVES!!! Do not touch the area between the o-ring and the tip even with the gloves. The grease will contaminate the microscope vacuum system. Grids are first put to the correct places in the holder by sharp tweezers. Then a circlip is taken with the tool and seated on top of the grid, so that it fastens the grid on its place. The seating of the circlip can be ensured by gently pushing it with the other tool. The place number one is the outmost in the four place holder. The selected grid is indicated in the holder as white spots, for example the grid number four = four white spots. Circlips and tools for handle them. Places for grids. 5

6 5. Aligning The microscope is usually quite stable. Do the alignment only if you notice the alignment is not good enough. (Objective aperture needs to be centered always and usually stigmators need some tuning and gun tilts if intensity is low.) 5.1 Check before aligning that: 1) Objective and selected-area apertures are OUT Condenser aperture (should be always IN pin pointing left) Objective aperture (OUT when pin pointing right) Selective area aperture (OUT when pin pointing right) 2) Objective lens current is in optimal setting (= press eucentric focus button) 6

7 5.2 Gun tilt (Aligning beam to optical axis) 1) Find the empty area without sample 2) Select ca x magnification and spot size 3 3) Focus using the Intensity button and center the beam using trackball on the left panel 4) Spread the beam so that the beam almost fully covers the fluorescent screen (turn clockwise Intensity button) 5) Select Gun tilt from workset Tune and Direct Alignments window 6) Maximize the beam intensity using multifunctioning buttons OR minimize exposure values on the screen 5.3 Gun shift 1. Select Gun shift from the Direct Alignments window 2. Select ca x magnification (and empty area without sample) 3. Focus the beam using the Intensity button and center the beam using the trackball on the left panel 4. Select spot size 9 (Button R3). If the beam disappears, select larger spot (smaller number) first and center that first and then go to spot size Center the beam using trackball (beam shift) on the left panel 6. Change to the spot size 3 (Button L3) 7. Center the beam using multifunction buttons 8. Repeat the steps 4 to 7 until the beam stays in the center at both spot sizes 9. Usually 1 or 2 repetitions is enough 5.4 Adjust Beam tilt pivot point X and Y USUALLY YOU CAN SKIP THIS ALIGNMENT!!! But it is very easy to do 1. Focus the beam 2. Select Beam tilt pivot X from the Direct Alignments window 3. Adjust the values using the multifunction buttons (both) until the beam doesn t move 4. Beam does not have to be centered 5. Then repeat same for Beam tilt pivot Y 7

8 5.5 Adjust Beam shift USUALLY YOU CAN SKIP THIS ALIGNMENT!!! But it is very easy to do 1. Select Beam Shift from the Direct Alignments window 2. Center the beam using the multifunction buttons (or left trackball) 3. Press Done 5.6 Condenser aperture centering USUALLY YOU CAN SKIP THIS ALIGNMENT. DO if you change the aperture size or if you notice that is misaligned (misaligned = beam intensity does not spread symmetrically when beam is over/under focused) 1. Select ca x magnification 2. Focus intensity of beam using the Intensity button and center beam using the trackball of the left panel 3. Then spread the beam (clockwise the Intensity button) until it almost fully covers the screen 4. Center the beam by adjusting the condenser aperture (the top one) with screws in the center and on the right 5.7 Setting sample to the Eucentric height DO THIS ALWAYS! 1. Find the sample and magnification x is quite OK. 2. Spread the beam with the Intensity button; over the fluorescent screen 3. Press L1 button (that will activate the alpha wobbler) 4. Minimize sample movement by adjusting the height of the sample using the Z-axis pushbutton on the right panel 5. Unselect Wobbler by pressing L1 button again 5.8 Rotation center (voltage or current center) 1. Find the sample and some small details which you can magnify up to x (e.g. small hole, sham sharp point etc.) 2. Select magnification over x (preferably ~ x) and focus the sample 3. Select Rotation center from the Direct Alignments window. Now Focus Step -function i.e. the lower rim of the Focus is Focus Wobbler Amplitude 4. Minimize the amplitude by turning focus step counter clockwise i.e. until the sample doesn t wobble 5. Check the sample focus again; use the upper rim of the Focus button. 6. Increase the focus wobbler amplitude by turning Focus step clockwise (1 or 2 steps) so that you can see the focus to wobble from underfocus to overfocus 7. Adjust Rotation center using multifunction buttons so that the sample movement is minimized (you may need to adjust beam using trackball during alignment) 8. Press Done 8

9 5.9 Insert objective aperture and center it DO THIS ALWAYS! NB! Never let the direct diffraction beam go to the camera! (But anyway we are not using camera here..) 1. Set the magnification to ca x 2. Spread the beam (turn clockwise the Intensity button) 3. Select the Diffraction mode from the right panel 4. Camera length approx is OK 5. Focus the diffraction pattern, use the binocular If the intensity is too high or you cannot focus the diffractions pattern. Insert selected area diffraction aperture and center it (size 2 or 3) 6. Put the objective aperture in (typically number 1 or 3); the objective aperture is the middle one of the apertures 7. Center the objective aperture with respect to the diffraction pattern using the screws of the objective aperture in the center and on the right 8. Deselect the diffraction mode NB! Never let the direct diffraction beam go to the camera! If diffraction is going to the camera remove Diffraction mode or insert screen with R1 button 9

10 5.10 Objective stigmators If you have carbon film grid use carbon film to get an amorphous scattering otherwise use your sample 1. Use Live-FFT. Take ca x magnification 2. Observe the rings at the Live-FFT window. It can be seen at a slight underfocus (Image A and C). If the peak is like ellipse (Image A), stigmators has to be adjusted. 3. Select Workset Tune Stigmators Objective. First copy the current active settings to other memory position by using the mouse right button (example copy 1 to 2) so that you can recover the values if everything goes wrong 4. Then correct stigmators by using multifunction buttons. (First try to get symmetrical spherical pattern when sample is underfocused (Image C) and then try to minimize patter when sample is focus. (Image D) Snap shots of live-fft imaged of carbon film. Micrographs A and B taken with misaligned object stigmators and C and D with aligned ones. A and C taken at sample underfocus and B and D at sample focus. 10

11 Routines performed after sample change Set sample to eucentric height. Hints and notes Save all the micrographs to the Z-disk. Setting Int Zoom at the Beam Settings window will make intensity to be constant when the magnification is changed. Wobbler on the right panel can be used for focusing, especially at low magnifications. When the sample is in-focus you see only one image. Note also that low magnification calibration is very sensitive to focus. If your sample is out of focus magnification will be quite different. Fluorescent screen lift is R1 button on the right hand panel. Troubleshooting If hand panel hangs, detach and attach the usb-cable from the panel. This usually solves the problem. If vacuum system fails when you insert or extract the sample holder. Stop and start vacuum again using the Vac push button on the right side of the camera chamber. In case of any other problems call (Janne Ruokolainen) If you need to restart the computer After the restart: Start the vacuum. "Vac" button on the right side of the camera chamber. Select the high tension 120 kv and the emission current step value 11

Basic Users Manual for Tecnai-F20 TEM

Basic Users Manual for Tecnai-F20 TEM Basic Users Manual for Tecnai-F20 TEM NB: This document contains my personal notes on the operating procedure of the Tecnai F20 and may be used as a rough guide for those new to the microscope. It may

More information

FEI Tecnai G 2 F20 Operating Procedures

FEI Tecnai G 2 F20 Operating Procedures FEI Tecnai G 2 F20 Operating Procedures 1. Startup (1) Sign-up in the microscope log-sheet. Please ensure you have written an account number for billing. (2) Log in to the computer: Login to your account

More information

Operating the Hitachi 7100 Transmission Electron Microscope Electron Microscopy Core, University of Utah

Operating the Hitachi 7100 Transmission Electron Microscope Electron Microscopy Core, University of Utah Operating the Hitachi 7100 Transmission Electron Microscope Electron Microscopy Core, University of Utah Follow the procedures below when you use the Hitachi 7100 TEM. Starting Session 1. Turn on the cold

More information

1.2. Make sure the viewing screen is covered (exposure to liquid N 2 may cause it to crack).

1.2. Make sure the viewing screen is covered (exposure to liquid N 2 may cause it to crack). FEI Tecnai F20 S/TEM: imaging in TEM mode Nicholas G. Rudawski ngr@ufl.edu (805) 252-4916 (352) 392-3077 Last updated: 01/21/18 1. Filling the cold trap (if needed) 1.1. Prior to use, the cold trap needs

More information

Protective Equipment Nitrile gloves for handling sample holder and safety glasses for filling liquid nitrogen dewar.

Protective Equipment Nitrile gloves for handling sample holder and safety glasses for filling liquid nitrogen dewar. Emergency Information: 1. Medical Emergencies: Contact 911 and McGill Security 514.398.3000 2. Leave TEM as is. Do NOT shut down the vacuum system. 3. If possible, turn off High Tension and Close Column

More information

Full-screen mode Popup controls. Overview of the microscope user interface, TEM User Interface and TIA on the left and EDS on the right

Full-screen mode Popup controls. Overview of the microscope user interface, TEM User Interface and TIA on the left and EDS on the right Quick Guide to Operating FEI Titan Themis G2 200 (S)TEM: TEM mode Susheng Tan Nanoscale Fabrication and Characterization Facility, University of Pittsburgh Office: M104/B01 Benedum Hall, 412-383-5978,

More information

2 How to operate the microscope/obtain an image

2 How to operate the microscope/obtain an image Morgagni Operating Instructions 50079 010912 2-1 2 ow to operate the microscope/obtain an image 2.1 Starting the microscope 2.1.1 Starting the microscope with several manually-operated steps 1. Turn on

More information

1. Specimen Holder Removal, Loading, and Insertion

1. Specimen Holder Removal, Loading, and Insertion OPERATION OF THE PHILIPS CM-200 FEG-TEM When not in use, the CM-200 should be in the MICROSCOPE ON configuration with the HIGH TENSION ON (illuminates green when the high tension is on).. The microscope

More information

Please follow these instructions for use of the Philips CM100 TEM. Adopted from website below.

Please follow these instructions for use of the Philips CM100 TEM. Adopted from website below. Please follow these instructions for use of the Philips CM100 TEM. Adopted from website below. http://staff.washington.edu/wpchan/if/cm100_inst.shtml Instructions for the Philips CM100 TEM and peripherals

More information

MSE 460 TEM Lab 2: Basic Alignment and Operation of Microscope

MSE 460 TEM Lab 2: Basic Alignment and Operation of Microscope MSE 460 TEM Lab 2: Basic Alignment and Operation of Microscope Last updated on 1/8/2018 Jinsong Wu, jinsong-wu@northwestern.edu Aims: The aim of this lab is to familiarize you with basic TEM alignment

More information

2. Raise HT to 200kVby following the procedure explained in 1.6.

2. Raise HT to 200kVby following the procedure explained in 1.6. JEOL 2100 MANUAL Quick check list 1. If needed, fill the reservoir with LN2 2. Raise HT to 200kVby following the procedure explained in 1.6. 3. Insert specimen holder into TEM (Insert holder in airlock,

More information

1.3. Before loading the holder into the TEM, make sure the X tilt is set to zero and the goniometer locked in place (this will make loading easier).

1.3. Before loading the holder into the TEM, make sure the X tilt is set to zero and the goniometer locked in place (this will make loading easier). JEOL 200CX operating procedure Nicholas G. Rudawski ngr@ufl.edu (805) 252-4916 1. Specimen loading 1.1. Unlock the TUMI system. 1.2. Load specimen(s) into the holder. If using the double tilt holder, ensure

More information

JEOL JEM-1400 Transmission Electron Microscope Operating Instructions

JEOL JEM-1400 Transmission Electron Microscope Operating Instructions JEOL JEM-1400 Transmission Electron Microscope Operating Instructions Anti-contamination device Objective aperture Objective aperture translation knobs Specimen holder Pump/air switch Left hand control

More information

Tecnai T12 Operating Procedures

Tecnai T12 Operating Procedures Tecnai T12 Operating Procedures I. Initial Procedures 1 II. Accelerating Voltage 3 III. Specimen Loading and Holder Insertion/Removal 3 IV. Emission Current 7 V. Alignment 7 VI. Camera Control and Imaging

More information

Procedures for Performing Cryoelectron Microscopy on the FEI Sphera Microscope

Procedures for Performing Cryoelectron Microscopy on the FEI Sphera Microscope Procedures for Performing Cryoelectron Microscopy on the FEI Sphera Microscope The procedures given below were written specifically for the FEI Tecnai G 2 Sphera microscope. Modifications will need to

More information

FEI Falcon Direct Electron Detector. Best Practice Document

FEI Falcon Direct Electron Detector. Best Practice Document FEI Falcon Direct Electron Detector Best Practice Document 2 1. Introduction FEI Falcon Direct Electron Detector Best Practice Application Guide The FEI Falcon Detector is based on direct electron detection

More information

Last updated 6/12/18. F20 User Manual at the Simons Electron Microscopy Center

Last updated 6/12/18. F20 User Manual at the Simons Electron Microscopy Center F20 User Manual at the Simons Electron Microscopy Center 1 Table of Contents F20 Information Sheet 2 F20 User Guide (starting your session) 3 F20 User Guide (ending your session) 5 Cryo Screening with

More information

MSE 595T Transmission Electron Microscopy. Laboratory III TEM Imaging - I

MSE 595T Transmission Electron Microscopy. Laboratory III TEM Imaging - I MSE 595T Basic Transmission Electron Microscopy TEM Imaging - I Purpose The purpose of this lab is to: 1. Make fine adjustments to the microscope alignment 2. Obtain a diffraction pattern 3. Obtain an

More information

CM20 USER GUIDE. Duncan Alexander, CIME 2010

CM20 USER GUIDE. Duncan Alexander, CIME 2010 CM20 USER GUIDE Duncan Alexander, CIME 2010 CM20 START UP AND CHECK LIST 2 SPECIMEN EXCHANGE 5 - REMOVING SAMPLE HOLDER 6 - INSERTING SAMPLE HOLDER 7 TURNING ON HT 8 STARTING THE FILAMENT 9 GUN TILT ALIGNMENT

More information

Operating F20/F30 with SerialEM

Operating F20/F30 with SerialEM Chen Xu xuchen@brandeis.ede $BrandeisEM: ~emdoc-xml/en_us.iso8859-1/articles/operating-f20-or-f30/article.xml, 1 2013-01-19 01:42:20 xuchen Exp$ This is a quick check list for the Tecnai F20 or Tecnai

More information

LEO 912 TEM Short Manual. Prepared/copyrighted by RH Berg Danforth Plant Science Center

LEO 912 TEM Short Manual. Prepared/copyrighted by RH Berg Danforth Plant Science Center LEO 912 TEM Short Manual Prepared/copyrighted by RH Berg Danforth Plant Science Center Specimen holder [1] Never touch the holder (outside of the O-ring, double-headed arrow) because finger oils will contaminate

More information

User Operation of JEOL 1200 EX II

User Operation of JEOL 1200 EX II **Log onto Computer** Open item program Start Up Procedure User Operation of JEOL 1200 EX II 1. If scope is not running, locate an electron microscopy technician (EMT) to find out why not. 2. Turn up brightness

More information

COMPACT MANUAL FOR GI USERS OF THE JEM 1400 FLASH BEGINNERS (For internal use only) Gray means additional information at the end of this mini-manual

COMPACT MANUAL FOR GI USERS OF THE JEM 1400 FLASH BEGINNERS (For internal use only) Gray means additional information at the end of this mini-manual 1 COMPACT MANUAL FOR GI USERS OF THE JEM 1400 FLASH BEGINNERS (For internal use only) Gray means additional information at the end of this mini-manual ABOUT THIS MICROSCOPE (room HG01.240) The JEM-1400Flash

More information

05/20/14 1. Philips CM200T. Standby Condition

05/20/14 1. Philips CM200T. Standby Condition 05/20/14 1 Philips CM200T Standby Condition HT and filament off, HT setting at 200kV. RESET HOLDER, center sample tilt knobs, and remove sample. Mag ~ 5-10kX Objective and SA apertures out, C2 aperture

More information

1.1. In regular TEM imaging mode, find a region of interest and set it at eucentric height.

1.1. In regular TEM imaging mode, find a region of interest and set it at eucentric height. JEOL 2010F operating procedure Covers operation in STEM mode (See separate procedures for operation in TEM mode and operation of EDS system) Nicholas G. Rudawski ngr@ufl.edu (805) 252-4916 NOTE: this operating

More information

Basic Operating Instructions for Strata Dual Beam 235 FIB/SEM

Basic Operating Instructions for Strata Dual Beam 235 FIB/SEM Basic Operating Instructions for Strata Dual Beam 235 FIB/SEM Warning Always adjust your specimen height before closing the chamber door to make sure your specimen will not hit the bottom of the lens;

More information

JEOL 6700 User Manual 05/18/2009

JEOL 6700 User Manual 05/18/2009 JEOL 6700 User Manual 05/18/2009 LOG IN to your session on the computer to the right of the microscope. Starting Conditions 1. Click the button and read the Penning Gauge to ensure that the microscope

More information

JEOL 6500 User Manual

JEOL 6500 User Manual LOG IN to your session on the computer to the left of the microscope. Starting Conditions 1. Press Ctrl-Alt-Del and log on to the microscope computer. Click on JEOL PC SEM 6500 icon. Click yes if message

More information

Operating Checklist for using the Scanning Electron Microscope, JEOL JSM 6400.

Operating Checklist for using the Scanning Electron Microscope, JEOL JSM 6400. Smith College August 2005 Operating Checklist for using the Scanning Electron Microscope, JEOL JSM 6400. CONTENT, page no. Pre-Check, 1 Specimen Insertion, 1 Startup, 2 Filament Saturation, 2 Beam Alignment,

More information

STANDARD OPERATING PROCEDURE: JEOL TEM-2100

STANDARD OPERATING PROCEDURE: JEOL TEM-2100 STANDARD OPERATING PROCEDURE: JEOL TEM-2100 Purpose of this Instrument: Essential tool for structural characterization of natural or synthesized nanostructures. Location: WVU - Engineering Sciences Building

More information

SEM Training Notebook

SEM Training Notebook SEM Training Notebook Lab Manager: Dr. Perry Cheung MSE Fee-For-Service Facility Materials Science and Engineering University of California, Riverside March 8, 2018 (rev. 3.5) 1 Before you begin Complete

More information

JEOL JEM 2010 TRAINING TRANSMISSION ELECTRON MICROSCOPE USER MANUAL

JEOL JEM 2010 TRAINING TRANSMISSION ELECTRON MICROSCOPE USER MANUAL JEOL JEM 2010 TRAINING TRANSMISSION ELECTRON MICROSCOPE USER MANUAL Version 5.1 EM Facility CMSE-SEF Massachusetts Institution of Technology TABLE OF CONTENTS 1. Specifications...2 1.1 Performance...2

More information

FEI Titan Image Corrected STEM

FEI Titan Image Corrected STEM 05/03/16 1 FEI Titan 60-300 Image Corrected STEM Standby Condition HT setting at 300kV, Col. Valves Closed RESET Holder and remove sample. Mag ~ 5-10kX Objective and SA apertures out, C2 aperture at 150µm

More information

STEM alignment procedures

STEM alignment procedures STEM alignment procedures Step 1. ASID alignment mode 1. Write down STD for TEM, and then open the ASID control window from dialogue. Also, start Simple imager viewer program on the Desktop. 2. Click on

More information

OPERATION OF THE HITACHI S-450 SCANNING ELECTRON MICROSCOPE. by Doug Bray Department of Biological Sciences University of Lethbridge

OPERATION OF THE HITACHI S-450 SCANNING ELECTRON MICROSCOPE. by Doug Bray Department of Biological Sciences University of Lethbridge OPERATION OF THE HITACHI S-450 SCANNING ELECTRON MICROSCOPE by Doug Bray Department of Biological Sciences University of Lethbridge Revised September, 2000 Note: The terms in bold in this document represent

More information

This document assumes the user is already familiar with basic operation of the instrument in TEM mode and use of the Microscope Control interface.

This document assumes the user is already familiar with basic operation of the instrument in TEM mode and use of the Microscope Control interface. FEI Tecnai F20 S/TEM: imaging in STEM mode Nicholas G. Rudawski ngr@ufl.edu (805) 252-4916 (352) 392-3077 Last updated: 05/10/18 This document assumes the user is already familiar with basic operation

More information

Tecnai on-line help manual --

Tecnai on-line help manual -- Tecnai on-line help Alignments 1 Tecnai on-line help manual -- Alignments Table of Contents 1 Alignments in the Tecnai microscope...5 2 Alignment procedures...6 3 Introduction to electron optics...11 3.1

More information

How to use the Jeol 1010 TEM of GI (Liesbeth own GI version)

How to use the Jeol 1010 TEM of GI (Liesbeth own GI version) How to use the Jeol 1010 TEM of GI (Liesbeth own GI version) 1.Load the specimen Load a grid into the rod holder: USE ONLY THE TOP POSITION (blue arrow), Specimen selection on 1 (The rear one is only a

More information

SEM Training Notebook

SEM Training Notebook SEM Training Notebook Lab Manager: Dr. Perry Cheung MSE Fee-For-Service Facility Materials Science and Engineering University of California, Riverside December 21, 2017 (rev. 3.4) 1 Before you begin Complete

More information

Standard Operating Procedure for the Amray 1810 Scanning Electron Microscope Version: 29 NOVEMBER 2014

Standard Operating Procedure for the Amray 1810 Scanning Electron Microscope Version: 29 NOVEMBER 2014 Standard Operating Procedure for the Amray 1810 Scanning Electron Microscope Version: 29 NOVEMBER 2014 1. Utility Requirements a. System power is supplied by two 120 VAC/20 A circuits. When doing maintenance

More information

This document assumes the user is already familiar with basic operation of the instrument in TEM mode and use of the digital camera.

This document assumes the user is already familiar with basic operation of the instrument in TEM mode and use of the digital camera. FEI Tecnai F20 S/TEM: acquiring diffraction patterns Nicholas G. Rudawski ngr@ufl.edu (805) 252-4916 (352) 392-3077 Last updated: 10/18/17 This document assumes the user is already familiar with basic

More information

1.1. Log on to the TUMI system (you cannot proceed further until this is done).

1.1. Log on to the TUMI system (you cannot proceed further until this is done). FEI DB235 SEM mode operation Nicholas G. Rudawski ngr@ufl.edu (805) 252-4916 1. Sample loading 1.1. Log on to the TUMI system (you cannot proceed further until this is done). 1.2. The FIB software (xp)

More information

Transmission Electron Microscopy 9. The Instrument. Outline

Transmission Electron Microscopy 9. The Instrument. Outline Transmission Electron Microscopy 9. The Instrument EMA 6518 Spring 2009 02/25/09 Outline The Illumination System The Objective Lens and Stage Forming Diffraction Patterns and Images Alignment and Stigmation

More information

Operating Checklist for using the Scanning Electron. Microscope, JEOL JSM 6400.

Operating Checklist for using the Scanning Electron. Microscope, JEOL JSM 6400. Smith College August 2009 Operating Checklist for using the Scanning Electron Microscope, JEOL JSM 6400. CONTENT, page no. Pre-Check 1 Startup 1 Specimen Insertion 2 Filament Saturation 2 Beam Alignment

More information

Title: Amray 1830 SEM#2 Semiconductor & Microsystems Fabrication Laboratory Revision: D Rev Date: 03/18/2016

Title: Amray 1830 SEM#2 Semiconductor & Microsystems Fabrication Laboratory Revision: D Rev Date: 03/18/2016 Approved by: Process Engineer / / / / Equipment Engineer 1 SCOPE The purpose of this document is to detail the use of the Amray 1830 SEM. All users are expected to have read and understood this document.

More information

FE-SEM SU-8020 Operating manual (Preliminary version)

FE-SEM SU-8020 Operating manual (Preliminary version) FE-SEM SU-8020 Operating manual (Preliminary version) 2016/04/11 Seimitsu Bunseki sitsu lab. Starting up 1.Turn on the Display switch. Windows OS is starting up 2. Select the user SU-8000. 3. Click the

More information

SEM OPERATION IN LOW VACUUM MODE

SEM OPERATION IN LOW VACUUM MODE SEM OPERATION IN LOW VACUUM MODE Instructions for JEOL 5800 LV The EVAC light of the SEM specimen chamber should be already lit when you approach the SEM & the SEM will have been left in the high vacuum

More information

JSM 6060 LV SCANNING ELECTRON MICROSCOPE STANDARD OPERATING PROCEDURES

JSM 6060 LV SCANNING ELECTRON MICROSCOPE STANDARD OPERATING PROCEDURES JSM 6060 LV SCANNING ELECTRON MICROSCOPE STANDARD OPERATING PROCEDURES RULES All users must go through a series of standard operation procedure training. For more information contact: Longlong Liao Teaching

More information

Using the Hitachi 3400-N VP-SEM

Using the Hitachi 3400-N VP-SEM Using the Hitachi 3400-N VP-SEM Opening the Chamber to Load Specimens (This may also be done later using the software) 1. Click the AIR button on the front of the machine: 2. Wait a few minutes until you

More information

Section 1: TEM parts and functions... 2

Section 1: TEM parts and functions... 2 Introduction The set of instructions below are written by Charlie Sanabria within the first few sessions of his TEM training process, and are intended for anyone interested in viewing the TEM operation

More information

1. Preliminary sample preparation

1. Preliminary sample preparation FEI Helios NanoLab 600 standard operating procedure Nicholas G. Rudawski ngr@ufl.edu (352) 392 3077 (office) (805) 252-4916 (cell) Last updated: 03/02/18 What this document provides: an overview of basic

More information

INSTRUCTIONS JEM-2010F FIELD-EMISSION TRANSMISSION ELECTRON MICROSCOPE WITH STEM CAPABILITY

INSTRUCTIONS JEM-2010F FIELD-EMISSION TRANSMISSION ELECTRON MICROSCOPE WITH STEM CAPABILITY INSTRUCTIONS JEM-2010F FIELD-EMISSION TRANSMISSION ELECTRON MICROSCOPE WITH STEM CAPABILITY August 2011 PRELIMINARIES OPERATION 1. Ensure that EMISSION and HT are on: The HT READY and FEG READY lights

More information

Introduction: Why electrons?

Introduction: Why electrons? Introduction: Why electrons? 1 Radiations Visible light X-rays Electrons Neutrons Advantages Not very damaging Easily focused Eye wonderful detector Small wavelength (Angstroms) Good penetration Small

More information

Dickinson College Department of Geology

Dickinson College Department of Geology Dickinson College Department of Geology Title: Equipment: BASIC OPERATION OF THE SCANNING ELECTRON MICROSCOPE (SEM) JEOL JSM-5900 SCANNING ELECTRON MICROSCOPE Revision: 2.2 Effective Date: 1/29/2003 Author(s):

More information

RAITH e-line OPERATING INSTRUCTIONS

RAITH e-line OPERATING INSTRUCTIONS RAITH e-line OPERATING INSTRUCTIONS 1) LOADING A SAMPLE a. Start the system i. On the Column PC (Right side monitor [R]), select the SmartSEM icon to on the desktop to begin the column software. ii. On

More information

Tecnai on-line help User interface 1 Tecnai F20 Tecnai F30 User interface Software version 2.1.8/3.0

Tecnai on-line help User interface 1 Tecnai F20 Tecnai F30 User interface Software version 2.1.8/3.0 Tecnai on-line help User interface 1 Tecnai on-line help manual -- User interface Table of Contents 1 User Interface...5 1.1 View modes...6 1.2 Toolbar...6 1.3 Workset tabs...7 1.4 Control panels...7 1.5

More information

UNIVERSITY OF WATERLOO Physics 360/460 Experiment #2 ATOMIC FORCE MICROSCOPY

UNIVERSITY OF WATERLOO Physics 360/460 Experiment #2 ATOMIC FORCE MICROSCOPY UNIVERSITY OF WATERLOO Physics 360/460 Experiment #2 ATOMIC FORCE MICROSCOPY References: http://virlab.virginia.edu/vl/home.htm (University of Virginia virtual lab. Click on the AFM link) An atomic force

More information

JEOL 2010 FasTEM & DigitalMicrograph User's Guide

JEOL 2010 FasTEM & DigitalMicrograph User's Guide JEOL 2010 FasTEM & DigitalMicrograph User's Guide Electron Microscopy Laboratory Instititute of Materials Science University of Connecticut The purpose of this manual is to remind you of the essential

More information

Amray 3600 FESEM. Standard Operating Procedure. v2.2 modified by Bryan Cord. General Notes...3. Sample Loading...5. System Loading...

Amray 3600 FESEM. Standard Operating Procedure. v2.2 modified by Bryan Cord. General Notes...3. Sample Loading...5. System Loading... Amray 3600 FESEM Standard Operating Procedure v2.2 modified 5.13.13 by Bryan Cord Contents General Notes...3 Sample Loading...5 System Loading...8 Imaging...12 Saving Data...16 System Unloading...18 Troubleshooting...20

More information

MSE 460 TEM Lab 4: Bright/Dark Field Imaging Operation

MSE 460 TEM Lab 4: Bright/Dark Field Imaging Operation MSE 460 TEM Lab 4: Bright/Dark Field Imaging Operation Last updated on 1/8/2018 Jinsong Wu, jinsong-wu@northwestern.edu Aims: The aim of this lab is to familiarize you with bright/dark field imaging operation.

More information

Scanning Electron Microscope FEI INSPECT F50. Step by step operation manual

Scanning Electron Microscope FEI INSPECT F50. Step by step operation manual Scanning Electron Microscope FEI INSPECT F50 Step by step operation manual Scanning Electron Microscope, FEI Inspect F50 FE-SEM-F Observation Flow Saving Data And Analysis Specimen preparation Error check

More information

Jeol JEM Responsible personell: Endy ( ) Online booking is compulsory!

Jeol JEM Responsible personell: Endy ( ) Online booking is compulsory! Jeol JEM 1230 Responsible personell: Endy (45279377) Online booking is compulsory! After training you will have access to working alone on the instrument. All insertion of samples is done by responsible

More information

Talos on-line help User interface 1 Software version 1.6 and higher

Talos on-line help User interface 1 Software version 1.6 and higher Talos on-line help User interface 1 Talos on-line help manual -- User interface Table of Contents 1 User Interface... 3 1.1 View modes... 4 1.2 Workset tabs... 4 1.3 Control panels... 5 1.4 Popup panels...

More information

SAMUEL ROBERTS NOBLE ELECTRON MICROSCOPY LABORATORY. Operating Procedures for the Zeiss 9 S-2. Transmission Electron Microscope

SAMUEL ROBERTS NOBLE ELECTRON MICROSCOPY LABORATORY. Operating Procedures for the Zeiss 9 S-2. Transmission Electron Microscope 1 SAMUEL ROBERTS NOBLE ELECTRON MICROSCOPY LABORATORY Operating Procedures for the Zeiss 9 S-2 Transmission Electron Microscope Prepared by Dr. Scott D. Russell Department of Botany and Microbiology September,

More information

The user should already be familiar with operation of the instrument in STEM mode, use of the Microscope Control interface, and TIA.

The user should already be familiar with operation of the instrument in STEM mode, use of the Microscope Control interface, and TIA. FEI Tecnai F20 S/TEM: EDS system operation Nicholas G. Rudawski ngr@ufl.edu (805) 252-4916 (352) 392-3077 Last updated: 01/22/18 The user should already be familiar with operation of the instrument in

More information

Figure 1 The Raith 150 TWO

Figure 1 The Raith 150 TWO RAITH 150 TWO SOP Figure 1 The Raith 150 TWO LOCATION: Raith 150 TWO room, Lithography area, NanoFab PRIMARY TRAINER: SECONDARY TRAINER: 1. OVERVIEW The Raith 150 TWO is an ultra high resolution, low voltage

More information

Titan on-line help manual -- Working with a FEG

Titan on-line help manual -- Working with a FEG 1 manual -- Working with a FEG Table of Contents 1 FEG Safety... 2 1.1 The column valves... 2 2 FEG States... 2 3 Starting the FEG... 4 4 Shutting the FEG down... 6 5 FEG Design... 6 5.1 Electron source...

More information

Titan on-line help manual -- User Interface

Titan on-line help manual -- User Interface 1 Titan on-line help manual -- User Interface Table of Contents 1 User Interface... 6 1.1 View modes... 7 1.2 Workset tabs... 7 1.3 Control panels... 7 1.4 Popup panels... 9 1.5 Display... 12 1.5.1 Binding

More information

Introduction of New Products

Introduction of New Products Field Emission Electron Microscope JEM-3100F For evaluation of materials in the fields of nanoscience and nanomaterials science, TEM is required to provide resolution and analytical capabilities that can

More information

PHYS 3153 Methods of Experimental Physics II O2. Applications of Interferometry

PHYS 3153 Methods of Experimental Physics II O2. Applications of Interferometry Purpose PHYS 3153 Methods of Experimental Physics II O2. Applications of Interferometry In this experiment, you will study the principles and applications of interferometry. Equipment and components PASCO

More information

ML7520 ML7530 DIOPTER ADJUSTMENT RING BINOCULAR BODY, INCLINED 30. (a) Field Iris Control Lever. (c) Filter Slots EYEPIECES, KHW10X

ML7520 ML7530 DIOPTER ADJUSTMENT RING BINOCULAR BODY, INCLINED 30. (a) Field Iris Control Lever. (c) Filter Slots EYEPIECES, KHW10X JAPAN DIOPTER ADJUSTMENT RING BINOCULAR BODY, INCLINED 30 (a) Field Iris Control Lever (c) Filter Slots EYEPIECES, KHW10X ANALYZER CONTROL LEVER (b) Aperture Iris Control Lever LIGHT SOURCE HOUSING VERTICAL

More information

Model SU3500 Scanning Electron Microscope

Model SU3500 Scanning Electron Microscope Model SU3500 Scanning Electron Microscope Modified and Parts taken from Hitachi Easy Operation Guide. Before using the Model SU3500 SEM, be sure to read the [GENERAL SAFETY GUIDELINES] in the instruction

More information

General information. If you see the instrument turned off, notify MIC personnel. MIC personnel will help you insert your samples into the instrument.

General information. If you see the instrument turned off, notify MIC personnel. MIC personnel will help you insert your samples into the instrument. JEOL JSM-7400F Table of contents General information.. 3 The operation panel. 4 The different sample holders and inserting the samples.. 5 Turning on the beam... 6 Stage map control... 8 Correcting astigmatism...

More information

CAPTURING IMAGES ON THE HIGH-MAGNIFICATION MICROSCOPE

CAPTURING IMAGES ON THE HIGH-MAGNIFICATION MICROSCOPE University of Virginia ITC Academic Computing Health Sciences CAPTURING IMAGES ON THE HIGH-MAGNIFICATION MICROSCOPE Introduction The Olympus BH-2 microscope in ACHS s microscope lab has objectives from

More information

Bruker Dimension Icon AFM Quick User s Guide

Bruker Dimension Icon AFM Quick User s Guide Bruker Dimension Icon AFM Quick User s Guide March 3, 2015 GLA Contacts Jingjing Jiang (jjiang2@caltech.edu 626-616-6357) Xinghao Zhou (xzzhou@caltech.edu 626-375-0855) Bruker Tech Support (AFMSupport@bruker-nano.com

More information

FEI Quanta 200 ESEM Basic instructions

FEI Quanta 200 ESEM Basic instructions FEI Quanta 200 ESEM Basic instructions Desktop and then start the UI. If the computer has restarted and you need to login, Username: supervisor and Password: supervisor Log-in to the Microscope using the

More information

SOP for Hitachi S-2150 Scanning Electron Microscope For review purposes only

SOP for Hitachi S-2150 Scanning Electron Microscope For review purposes only SOP for Hitachi S-2150 Scanning Electron Microscope For review purposes only Version 1.0 Prepared by D. Turnbull February 21, 2007. Please submit any omissions to the Author Note: This SEM is a recent

More information

Nikon Ti-E Microscope Manual. Rightmire Hall Ohio State University. Director: Tony Brown Rightmire

Nikon Ti-E Microscope Manual. Rightmire Hall Ohio State University. Director: Tony Brown Rightmire Nikon Ti-E Microscope Manual Rightmire Hall Ohio State University Director: Tony Brown Rightmire 060 292-1205 brown.2302@osu.edu Facility Manager: Paula Monsma Rightmire 062 293-0939 292-1367 monsma.1@osu.edu

More information

Horiba Jobin-Yvon LabRam Raman Confocal Microscope (GERB 120)

Horiba Jobin-Yvon LabRam Raman Confocal Microscope (GERB 120) Horiba Jobin-Yvon LabRam Raman Confocal Microscope (GERB 120) Please contact Dr. Amanda Henkes for training requests and assistance: 979-862-5959, amandahenkes@tamu.edu Hardware LN 2 FTIR FTIR camera 1

More information

ZEISS EVO SOP. May 2017 ELECTRON OPTICS

ZEISS EVO SOP. May 2017 ELECTRON OPTICS ZEISS EVO SOP May 2017 ELECTRON OPTICS The patented EVO column is the area of the SEM, where electrons are emitted, accelerated, deflected, focused, and scanned. Main characteristics of the EVO optics

More information

Operation Manual. Chap. 1 Attention. Please read the attention carefully before operating the machine.

Operation Manual. Chap. 1 Attention. Please read the attention carefully before operating the machine. Chap. 1 Attention Please read the attention carefully before operating the machine. 1. No magnetic devices should be placed in the vicinity of the plotter, specifically the carriage. 2. Prevent from dropping

More information

Horiba LabRAM ARAMIS Raman Spectrometer Revision /28/2016 Page 1 of 11. Horiba Jobin-Yvon LabRAM Aramis - Raman Spectrometer

Horiba LabRAM ARAMIS Raman Spectrometer Revision /28/2016 Page 1 of 11. Horiba Jobin-Yvon LabRAM Aramis - Raman Spectrometer Page 1 of 11 Horiba Jobin-Yvon LabRAM Aramis - Raman Spectrometer The Aramis Raman system is a software selectable multi-wavelength Raman system with mapping capabilities with a 400mm monochromator and

More information

TEM theory Basic optics, image formation and key elements

TEM theory Basic optics, image formation and key elements Workshop series of Chinese 3DEM community Get acquainted with Cryo-Electron Microscopy: First Chinese Workshop for Structural Biologists TEM theory Basic optics, image formation and key elements Jianlin

More information

Alignment of the camera

Alignment of the camera Related topics Detector Alignment, Rotation axis, tilt, Principle Alignment of the detector and the rotation stage is very important to get optimal quality images of a CT scan. In this experiment, the

More information

Scanning electron microscope

Scanning electron microscope Scanning electron microscope 6 th CEMM workshop Maja Koblar, Sc. Eng. Physics Outline The basic principle? What is an electron? Parts of the SEM Electron gun Electromagnetic lenses Apertures Chamber and

More information

Bruker Dimension Icon AFM Quick User s Guide

Bruker Dimension Icon AFM Quick User s Guide Bruker Dimension Icon AFM Quick User s Guide August 8 2014 GLA Contacts Jingjing Jiang (jjiang2@caltech.edu 626-616-6357) Xinghao Zhou (xzzhou@caltech.edu 626-375-0855) Bruker Tech Support (AFMSupport@bruker-nano.com

More information

User Manual. Digital Compound Binocular LED Microscope. MicroscopeNet.com

User Manual. Digital Compound Binocular LED Microscope. MicroscopeNet.com User Manual Digital Compound Binocular LED Microscope Model MD82ES10 MicroscopeNet.com Table of Contents i. Caution... 1 ii. Care and Maintenance... 2 1. Components Illustration... 3 2. Installation...

More information

Strata DB235 FESEM FIB

Strata DB235 FESEM FIB Strata DB235 FESEM FIB Standard Operating Procedure Revision: 5.0 Last Updated: August 16/2016, revised by Li Yang Overview This document will provide a detailed operation procedure of the Focused Ion

More information

Operation manual. Thanks very much for purchasing this. cutter/plotter. To ensure you make best use of your machine,

Operation manual. Thanks very much for purchasing this. cutter/plotter. To ensure you make best use of your machine, Operation manual Thanks very much for purchasing this cutter/plotter. To ensure you make best use of your machine, please read this manual carefully and thorughly beforhand. IMMEDIATELY power off the machine

More information

DISCO DICING SAW SOP. April 2014 INTRODUCTION

DISCO DICING SAW SOP. April 2014 INTRODUCTION DISCO DICING SAW SOP April 2014 INTRODUCTION The DISCO Dicing saw is an essential piece of equipment that allows cleanroom users to divide up their processed wafers into individual chips. The dicing saw

More information

ELECTRON MICROSCOPY. 13:10 16:00, Oct. 6, 2008 Institute of Physics, Academia Sinica. Tung Hsu

ELECTRON MICROSCOPY. 13:10 16:00, Oct. 6, 2008 Institute of Physics, Academia Sinica. Tung Hsu ELECTRON MICROSCOPY 13:10 16:00, Oct. 6, 2008 Institute of Physics, Academia Sinica Tung Hsu Department of Materials Science and Engineering National Tsing Hua University Hsinchu 300, TAIWAN Tel. 03-5742564

More information

User instructions Compound laboratory microscope

User instructions Compound laboratory microscope KERN & Sohn GmbH Ziegelei 1 D-72336 Balingen E-mail: info@kern-sohn.com User instructions Compound laboratory microscope Tel: +49-[0]7433-9933-0 Fax: +49-[0]7433-9933-149 Internet: www.kern-sohn.com KERN

More information

Chapter 2 Instrumentation for Analytical Electron Microscopy Lecture 7. Chapter 2 CHEM Fall L. Ma

Chapter 2 Instrumentation for Analytical Electron Microscopy Lecture 7. Chapter 2 CHEM Fall L. Ma Chapter 2 Instrumentation for Analytical Electron Microscopy Lecture 7 Outline Electron Sources (Electron Guns) Thermionic: LaB 6 or W Field emission gun: cold or Schottky Lenses Focusing Aberration Probe

More information

Reference and User Manual May, 2015 revision - 3

Reference and User Manual May, 2015 revision - 3 Reference and User Manual May, 2015 revision - 3 Innovations Foresight 2015 - Powered by Alcor System 1 For any improvement and suggestions, please contact customerservice@innovationsforesight.com Some

More information

CATHODOLUMINESCENCE IMAGING UNIVERSITY OF ST ANDREWS

CATHODOLUMINESCENCE IMAGING UNIVERSITY OF ST ANDREWS CATHODOLUMINESCENCE IMAGING AT THE UNIVERSITY OF ST ANDREWS Instruction Guide by Adrian Finch 2 Noddy s Guide to Using the CL at St Andrews (SHORT version) 1. Switch on plugs at Wall (Microscope, Luminoscope

More information

BX-61: Brightfield Instruction /Continue to scroll for Fluorescent Instuctions

BX-61: Brightfield Instruction /Continue to scroll for Fluorescent Instuctions BX-61: Brightfield Instruction /Continue to scroll for Fluorescent Instuctions Starting up: Schematic of Olympus BX-61. 1. Turn on Olympus microscope power box (left of microscope) with toggle switch on

More information

Indiana University JEM-3200FS

Indiana University JEM-3200FS Indiana University JEM-3200FS Installation Specification Model: JEM 3200FS Serial Number: EM 15000013 Objective Lens Configuration: High Resolution Pole Piece (HRP) JEOL Engineer: Michael P. Van Etten

More information

Things to check before start-up.

Things to check before start-up. Byeong Cha Page 1 11/24/2009 Manual for Leica SP2 Confocal Microscope Enter you name, the date, the time, and the account number in the user log book. Things to check before start-up. Make sure that your

More information

Check that the pneumatic hose is disconnected!!!! (unless your using the BSE detector, of course)

Check that the pneumatic hose is disconnected!!!! (unless your using the BSE detector, of course) JEOL 7000F BASIC OPERATING INSTRUCTIONS-Ver.-2.0 Note: This is minimal operation checklist and does not replace the other reference manuals. Read the manual for Specimen Exchange (JEOL 7000 Specimen Exchange

More information

Standard Operating Procedure

Standard Operating Procedure Standard Operating Procedure Nanosurf Atomic Force Microscopy Operation Facility NCCRD Nanotechnology Center for Collaborative Research and Development Department of Chemistry and Engineering Physics The

More information