Bruker Nano. M4 tornado. High performance micro-xrf spectrometer. think forward

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1 Bruker Nano M4 tornado High performance micro-xrf spectrometer think forward µ-xrf

2 M4 TORNADO setting standards in µ-xrf µ-xrf is the method of choice for highly sensitive and non-destructive elemental analysis of all kinds of samples, including inhomgeneous and irregular shaped specimens. The Bruker M4 TORNADO was designed as a versatile instrument to support the fast and accurate high-resolution analysis of both small and large specimens. Samples require little or even no preparation at all for examination in the M4 TORNADO. Excellent spatial resolution using polycapillary X-ray optics for smallest spot sizes down to 25 µm for Mo K Flexible excitation through use of up to two X-ray tubes and 6 filters Ultra fast spectrum acquisition with XFlash detector technology, additional speed improvement through multiple detector setups TurboSpeed X-Y-Z stage for distribution analysis on the fly, supported by high quality sample imaging with variable magnifications Vacuum sample chamber for optimized light element performance, EasyLoad function for fast and convenient sample changing Reliable quantification of bulk material using a standardless FP model, accurate standardless analysis of multi-layer coatings

3 Instrument highlights Efficient sample excitation The use of polycapillary X-ray optics permits the generation of high fluorescence intensities even from the smallest sample areas. The X-ray optics accumulate tube radiation from a large solid angle and concentrate it on spots as small as 25 μm for Mo K radiation. The optional use of two X-ray tubes permits very effective excitation of special groups of elements by choosing different target materials or by using one tube with a collimator. Fast spectrum acquisition The M4 TORNADO uses Bruker s XFlash silicon drift detector (SDD) technology, which combines count rates of up to 300 kcps (for a single detector setup) with energy resolution down to 145 ev. The 30 mm 2 active detector area allows the collection of radiation from a large solid angle. A second detector is optionally available. TurboSpeed stage The large sample stage travels at a speed of up to 200 mm/s. Combined with on-the-fly measurement, this ensures fastest possible mapping, as the detector is continuously collecting radiation. Extra time is only required for return travel in case of multi-frame measurments. Due to the high precision of the TurboSpeed stage, such multi-frame measurements can be carried out routinely. Information on element distribution can already be obtained with an acquisition time of 3 ms per pixel. This speed is unmatched by any other instrument in the market, providing a first overview of the sample composition within minutes. Additional frames will add detail for refined analysis. Convenience and ease-of-use Convenience and easy handling are provided for the user through: The EasyLoad function for fast sample changing The large sample chamber enabling a stage travel of 200 mm x 155 mm x 120 mm Sample positioning supported by a fish eye camera and two optical video microscopes with 10 and 100x magnification Auto focus function for setting the sample height correctly Mosaic (tiled) images for large area maps, and Distribution analysis with HyperMap, which collects complete data sets, supporting offline data evaluation. Accurate and flexible quantification The M4 TORNADO uses of standardless analysis based on fundamental-parameter (FP) models, as the analyzed samples are usually inhomogeneous. The M- Quant software module uses a FP model to provide reliable results on the composition of bulk samples. The closely related quantification package M-Coat allows the analysis of layer systems. Fast mapping of a geological sample with 5 ms dwell time per pixel.

4 Applications The M4 TORNADO is very versatile. Applications include forensics, geology, RoHS measurements, archeometry, bioscience and many more. Forensics and archeomtery The M4 TORNADO is especially suitable for forensic analysis. This includes examination of layer systems, like paint, extremely small material fragments and gunshot residue. Furthermore the M4 TORNADO is ideal fo rthe non-destructive analysis of documents and small works of art, e.g. for authentication. Geology The large sample stage of the M4 TORNADO is predestined for the analysis of geological samples. Phase analyses or searches for trace elements can be performed to study geological processes such as rock formation or asses ores for their mineral content. The example below shows a the results of the analysis of a sediment sample. The M4 TORNADO software offers multiple options for analysis and data representation. On the lower right a HyperMap can be seen. Mosaic map of a Russian icon, shown above is a photography of the work of art Image size: 820 x 1100 mm 2 Scan res.: 604 x 800 pixels Dwell time: 7 x 10 ms / pixel Pixel dist.: 50µm A line scan was extracted from the map, the position of this line scan is indicated through a green line. It is possible to display the distribution of elements along a line of single pixel width or to add adjacent pixels on both sides of the line. This is a useful tool to improve statistics for better visibility. Multi-element distribution containing the elements iron (Fe), zinc (Zn), chrome (Cr), lead (Pb), Calcium (Ca) and mercury (Hg), collected in 7 frames with 10 ms dwell time Fe Si Al Ti S Map and line scan of a sediment sample. Above is the tiled video image. A section of the image (indicated through the green frame) was analyzed. Image size: 55 x 24 mm 2 Scan resolution: 1000 x 117 pixels Dwell time: 100 ms / pixel Pixel distance: 50 µm Line scan (top) and map (below) of the sediment sample. The green line in the element map indicates the position of the line scan. The map itself contains the elements tin (orange), iron (red), calcium (dark blue), silicon (white), aluminium (light blue), titanium (light green) and sulphur (yellow)

5 Fast mosaic map of a mobile phone PCB, shown above is the tiled M4 video image Image size: 100 x 43 mm 2 Scan resolution: 1000 x 424 pixels Dwell time: 5 ms / pixel Total duration: 45 min Fast multi-element mapping Distribution of RoHS-relevant elements bromine (blue), chrome (orange) and lead (green) Restriction of the Use of Hazardous Substances RoHS With the increased awareness of environmental and health hazards, detection of substances imposing such risks has become increasingly important. Analyses to detremine compliance with the Restriction of teh Use of Hazardous Substances regulation can be performed with the M4 TORNADO. It can be used to determine heavy metal and other harmful element content, even if it is in the ppm range. Both the qualitative analysis of single points or the examination of element distributions is possible for various sample types. These include electronic components, toys, consumer products and others. The high excitation efficiency allows both fast screening and the detection of smallest traces. Coatings and layer systems X-ray fluorescence analysis is well suited for the analysis of layers on all kinds of materials, including multi-layer systems. The M4 TORNADO can perform these analyses with high spatial resolution and sensitivity. The M-Coat fundamentalparameter-based quantification package for layers provides fast and reliable results for these types of samples. It also provides information on layer thickness in the low nm range. Bioscience The examination of the metabolism of biological samples can provide valuable information on environmental conditions, health or diseases. Important indicators are the distribution of essential elements. Their distribution in plants, animals, or their organs, can be examined with high sensitivity using the M4 TORNADO. The fast data acquisition also permits screening of sensitive samples without causing damage. Element map of a dried daphnia prepared on Mylar foil Image size: 3.0 x 3.4 mm 2 Scan resolution: 150 x 168 pixels Dwell time: 100 ms / pixel Element map of a dried dogwood leaf prepared on Mylar foil Image size: 70 x 46 mm 2 Scan resolution: 900 x 588 px Dwell time: 50 ms / pixel

6 The powerful M4 TORNADO software Bruker s powerful analysis software, originally written for EDS analysis with electron microscopes, also provides maximum functionality and ease of use for the M4 TORNADO. Getting the most out of your measurement data The M4 TORNADO software offers point measurements, summation over arbitarily shaped objects, line scans and 2D maps, including quantification. All measurments can be performed directly or as part of HyperMap processing. HyperMap is Bruker s version of position tagged spectrometry and the most versatile instrument for on- or offline data mining. A full spectrum collected at every point is stored in a database together with a video image. Line scan Arbitrary lines can be drawn in the map to produce line scans. The results can be viewed under the Line scan tab. To make a line scan appear smoother, the software offers the option of adding adjacent pixels perpendicular to the scan line. This artificial broadening of the line improves statistics and smooths the element distribution lines. Point information Individual points in a map can be set by placing a cross hair in the HyperMap image. The respective spectrum can be viewed under the Spectrum tab. This can be used for a quick overview of the major constituents at the selected position Object analysis Arbitrarily shaped objects (rectangles, circles, polygons) can be drawn in the map, resulting in a sum spectrum over the selected area. This function is very useful for improving count statistics for the analysis of similarly composed regions. Single element distributions for the trace element titanium (see spectra on the opposite page), standard mode (top), using false color look up table with improved contrast (lower image) Sum spectrum and quantification results of object 6 in the screen shot on the next page

7 HyperMap 1 Acquisition and evaluation controls 2 Display tabs for Results 3 Analytical and data management tools 4 Map mixing controls 7 5 Point measuremnt 6 Object measurement 7 Line scan 4 Analyzing element maps Of course it is also possible to analyze maps as a whole. This can either be done through quantification or by simply altering the appearance by adding and removing elements from or changing their contribution to the mixed image. The mixed image itself can be fine-tuned by conventional image processing. Single element maps can be improved through false color display. Phase analysis and chemometry If phase distributions have to be evaluated in depth the AutoPhase tool is helpful. It provides several options for generating phase distribution images, through principal components analysis, clustering or by using objects drawn in the mapping image. Additionally, binary and ternary diagrams are offered for compositional analysis. Find smallest element traces The M4 TORNADO software includes MaximumPixelSpectrum (MaxSpec), which allows you to determine elements, even if they are only concentrated in a single pixel of the HyperMap and would otherise be overlooked. MaxSpec synthesizes a spectrum out of the highest count level found in every channel of every spectrum in the HyperMap. Adding these elements to the selection for map display enables their easy location in the sample. Comparison of the sum spectrum (red) and the MaximumPixelSpectrum (blue) of the sample in the screenshot makes the presence of the additional elements titanium (Ti) and phosphor (P) evident

8 Specifications M4 TORNADO M4 TORNADO Sample types Sample chamber size Stage size Measurement media Sample travel Max. travel Travel speed Excitation X-Ray tube parameters Target material Voltage Spot size Filters Detection solids, particles, liquids, layer systems W x D x H: 600 x 350 x 260 mm W x D: 330 x 170 mm Air or oil free vacuum, ready for measurement within 100 s W x D x H: 200 x 155 x 120 mm up to 200 mm/s due to the TurboSpeed stage High brilliance X-ray tube with capillary X-ray optics, optional: Simultaneous use of two tubes Rh, optionally: Mo, Ag, Cu, W 50 kv, 800 µa Less than 25µm for Mo K Up to 6 filters, according to customer requirements XFlash silicon drift detector, optionally simultaneous use of 2 detectors Detector parameters Sensitive area Energy resolution Instrument control Instrument control functions Spectra evaluation Distribution analysis Result presentation Power requirements Dimensions Quality & safety 30 mm² <145 ev at 200,000 cps State-of-the-art PC, operating system Windows XP or Windows 7 Complete control of tube parameters, filter, optical microscopes, sample illumination and sample positioning Peak identification, artifact and background correction, peak area calculation, quantification with standard-based and standardless models for bulk samples and layers systems Measurement on the fly, HyperMap capability Quantification results, statistical evaluation, element distribution (line scan, mapping) V (1P), 50/60 Hz W x D x H: 815 x 680 x 580 mm, 130 kg DIN EN ISO 9001:2000, CE certified, Fully radiation protected system; radiation < 1 μsv/h All configurations and specifications are subject to change without notice. Order No. DOC-B81-EXS004, Rev Bruker Nano GmbH. Printed in Germany. Bruker Nano GmbH Schwarzschildstraße Berlin Germany Phone +49 (30) Fax +49 (30) info@bruker-nano.de Bruker Nano 1239 Parkway Ave, Suite 203 Ewing, NJ USA Phone +1 (609) Fax +1 (609) info@bruker-nano.com Bruker AXS Pte Ltd 73 Science Park Drive #02-01 CINTECH I Singapore Phone +65 (6500) 7288 Fax +65 (6500) 7289 info@bruker.com.sg Sales representative: