Performance of chip-size wavelength detectors
|
|
- Ralf Garrett
- 6 years ago
- Views:
Transcription
1 Performance of chip-size wavelength detectors Oliver Schmidt, Peter Kiesel *, Michael Bassler Palo Alto Research Center Incorporated, 3333 Coyote Hill Rd., Palo Alto, CA * Corresponding author: peter.kiesel@parc.com Abstract: Chip-size wavelength detectors are composed from a linear variable band-pass filter and a photodetector array. The filter converts the incident spectral distribution into a spatial distribution that is recorded by the detector array. This concept enables very compact and rugged spectrometers due to the monolithic integration of all functional components on a single chip. This type of spectrometer reveals its most convincing advantages through appropriate systems integration. We discuss the advantages of this concept for spectroscopy of light distributions that are hard to focus onto the entrance slit of a conventional spectrometer, namely large light emitting areas and moving point-like light sources. The excellent spectral performance of the system is demonstrated for both light input geometries Optical Society of America OCIS codes: ( ) Spectrometers, ( ) Thin films, optical properties. References and links 1. N. Damean, S. K. Sia, V. Linder, M. Narovlyansky, and G. M. Whitesides, Space and time-resolved spectrophotometry in Microsystems, PNAS 102, (2005). 2. S. Grabarnik, R. Wolffenbuttel, A. Emadi, M. Loktev, E. Sokolova, and G. Vdovin, Planar double-grating microspectrometer, Opt. Express 15, 3581 (2007). 3. P. Kiesel, O. Schmidt, S. Mohta, S. Malzer, and N. M. Johnson, Compact, low-cost, and high resolution interrogation unit for optical sensors, Appl. Phys. Lett. 89, (2006). 4. N. M. Johnson, O. Schmidt, and S. M. Chokshi, Chip-Size Spectrometers (Palo Alto Research Center Incorporated, 2006) F. W. Kavanagh, Spectral wedge interference filter combined with purifying filters, United States Patent 2,708,389 (1955). 6. N. Gat, Spectrometer apparatus, United States Patent 5,166,755 (1992). 7. J. A. Wahl, J. S. Van Delden, and S. Tiwari, Multiple-fluorophore-specie detection with a tapered fabryperot fluorescence spectrometer, Appl. Opt. 44, (2005). 8. J. T. Olesberg, C. Cao, J. R. Yager, J. P. Prineas, C. Coretsopoulos, M. A. Arnold, L. J. Olafsen, and M. Santilli, Optical microsensor for continuous glucose measurements in interstitial fluid, SPIE Proc. 6094, (2006). 9. O. Schmidt, M. Bassler, P. Kiesel, C. Knollenberg, and N. Johnson, Fluorescence Spectrometer-on-afluidic-chip, Lab Chip 7, (2007). 10. O. Schmidt, P. Kiesel, S. Mohta, and N.M. Johnson, Resolving pm wavelength shifts in optical sensing, Appl. Phys. B 86, 593 (2006). 1. Introduction In recent years there has been a tremendous interest in developing sensor systems for health care service, industrial process monitoring and environmental monitoring. Typical measurements include proving the presence or absence of an analyte, determining the quality of an industrial process or monitoring the reaction or binding dynamics of an analyte in water, blood, aerosols, air, food, and other specimens. Optical spectroscopy can be extremely sensitive, selective and can be used for continuous real-time monitoring without contaminating the sample. Thus, they are used frequently in sensor applications. In general it is desirable to design optical systems that are much more (C) 2007 OSA 23 July 2007 / Vol. 15, No. 15 / OPTICS EXPRESS 9701
2 compact and rugged than what is currently available. Semiconductor laser diodes and light emitting diodes (LED) have helped to integrate powerful and reliable light sources into optical systems. Optical fibers and waveguide structures have drastically reduced alignment issues of optical systems and allow for compact and flexible systems. Still lacking for truly powerful optical systems are compact spectrometers that can be easily integrated in order to leverage the huge potential of the spectral dimension of such systems. Damean et al. [1] included a diffraction grating in their microfluidic chip in order to achieve on-chip wavelength separation but still relied on a bulky bright-field microscope to detect the spectrum. Final goal has to be a complete integration of the spectrometer function. Prism and grating based approaches are somehow problematic since they intrinsically need a distance between the dispersion and detection element for wavelength discrimination. This limitation has been addressed recently by clever design, thereby minimizing the volume of the spectrometer [2]. 2. Concept of chip-size wavelength detectors In this paper we discuss a concept for a wavelength detector that replaces the dispersive element by a spatially selective filter. The concept is based on a linear variable band-pass filter (LVF) which selectively transmits light at different locations depending on the lights wavelength and photo-detector arrays which record the light intensity behind the filter [3,4]. The filter is attached directly onto the photo-detector chip and can even be deposited directly onto the chip. The resulting detector provides compactness, robustness, and ease of fabrication. It leverages existing system components and manufacturing techniques and does not exceed the size of the photo-detector array chip. It has no moving parts and enables monolithic integration into optical systems. At the same time, it features high performance and flexibility because the filter is customizable for high spectral resolution or broad spectral range. A wide range of photo-detectors can be used for high sensitivity or fast read-out speed. The entire spectral range from the ultraviolet and visible range to the infrared spectral region can be addressed. Existing photo-detector arrays based on silicon, germanium, InAs, InGaAs or PbTe, or even bolometer arrays can be used. The basic, underlying concept was introduced many decades ago but was not implemented in many applications due to the lack of cheap and powerful detector arrays [5,6]. In recent years the topic has received new interest due to the demand for cheap and compact spectrometers [7,8]. Even so, chip-size spectrometers are still not significantly used because existing systems have not addressed the specific requirements and challenges of this technique that arise primarily from the unique light input geometry. Most applications try to simply replace a conventional spectrometer by a chip-size wavelength detector and do not take advantage of the distributed detection area of these devices, which is especially favorable for spectral characterization of large light emitting objects or moving particles as will be demonstrated in this paper. Further, many designs neglect the need for uniform large-area illumination of the detector. Another key issue, which has to be taken into account, is the angle dependence of the LVF to the incident light. In the following, these specific issues of the device are addressed. Design strategies and calibration procedures are described. Finally, it is demonstrated that a chip-size spectrometer can resolve a spectrum with the same accuracy as a conventional spectrometer. The photosensitive area of the wavelength detector is determined by the size of the LVF and the photo-diode array. The entire detector needs to be illuminated in order to benefit from the entire spectral range of the spectrometer. This operating mode is fundamentally different from conventional spectrometers where the light is focused onto a small slit in order to receive good wavelength separation (Fig. 1(a)). This makes a comparison of both spectrometers very difficult because it truly depends on the dimension and divergence of the incident light beam. In general, it appears that a grating based spectrometer is favorable for fixed point light sources which can be easily imaged onto the slit whereas the chip-size spectrometer is especially favorable for large light emitting areas such that no or only simple optics are necessary to direct the light onto the detector (Fig. 1(b)). In fact, the wavelength detector could be attached directly to the light emitting area. This allows a very simple installation (C) 2007 OSA 23 July 2007 / Vol. 15, No. 15 / OPTICS EXPRESS 9702
3 without critical alignment in addition to the advantage that the overall system is very compact and robust. Of course there are drawbacks of this technique. The detector determines the spectral information of the light source laterally, that is, by measuring different spectral components at different locations on the detector. Adverse effects on the spectrum have to be avoided either by illuminating the entire detector surface with a constant light intensity or by correcting for an inhomogeneous illumination. grating-based monochromator LVF CCD sensor LVF CCD sensor slit (a) Light source (b) (c) Fig. 1: Light input geometries of a grating based spectrometer (a) in comparison to a chip-size spectrometer. The chip-size spectrometer is particularly valuable for (b) large area light sources and (c) moving point-sources A special case is a moving light emitting object. Recording such a moving object with a long integration time effectively renders the point source into a large area light source (Fig. 1(c)). The geometry of the detector enables an optical detection method that can even take advantage of the motion of an optical source. The spectral information of the lightemitting object is gathered step-by-step while it is moving across the wavelength detector. A lab-on-a-chip system was proposed, which is designed to record the fluorescence spectrum of particles on-the-flow [9]. The particles are continuously excited by the excitation laser and emission spectra are recorded while the particle is traversing the detector. 3. Description of prototype A compact spectrometer was realized by mounting a broad-band LVF that covers the entire visible spectral range in front of a 16bit CCD camera. The distance between the filter and the CCD sensor was approximately 10mm due to the design of the camera. The camera had a resolution of pixels with a pixel size of µm 2. The exposure time could be varied between 30 µs and 4 s. The LVF covered the spectral range from 400 to 700 nm with a FWHM of the transmission peak of ~1% of the transmission peak wavelength and a spectral gradient of about 30 nm/mm. The resolution of the spectrometer is mostly determined by the FWHM of the LVF as described in detail elsewhere [10] which can be realistically designed between 1 and 10 nm in the visible spectral range. Note, that a smaller FWHM will increase the spectral resolution for trading light efficiency. This is similar to grating based spectrometers where changing the entrance slit width has the same effect. For spectral calibration purpose, light from a Halogen lamp was spectrally filtered by a monochromator and coupled into a polymer optical fiber. At the opposite end of the fiber the light was collimated and directed onto the detector such that the whole detector was illuminated similar to the situation depicted in Fig. 1(b). Due to the special transmission properties of the LVF monochromatic light propagates through the filter at a single sharp position, whereas the filter blocks the light at all other positions. By changing the wavelength of the incident light we correlate each position of the detector with a specific wavelength band, the width of the band given by the FWHM of the LVF. In order to achieve valid intensity values for all wavelength bands we need to account for the spectral dependency of the detector sensitivity C cam ( and the transmission function of the (C) 2007 OSA 23 July 2007 / Vol. 15, No. 15 / OPTICS EXPRESS 9703
4 LVF C LVF ( (both shown in Fig. 2(a)). For the LVF used in this experiment the transmission peak height and the FWHM increase almost proportionally with wavelength. Another important aspect for achieving an accurate spectrum is the correction for inhomogeneous illumination of the spectrometer. In practice it is quite challenging to assure homogeneous illumination. Therefore, we introduce referencing regions in the spectrometer which monitor the intensity distribution across the detector independently from the spectrum of light. In the present work we have realized this intensity referencing technique by doing two sequential measurements of the same light distribution. The first measurement is done with the filter mounted on top of the camera, such that the intensity distribution behind the filter yields spectral information about the incident light I raw (. The second measurement is done without the filter in order to determine the intensity distribution of the incident light I in (. Note, that the spatial intensity information I in (x) has been converted into a function of wavelength I in ( under consideration of the calibration procedure described above. Consequently, the correct spectral distribution I( can be calculated as follows: Iraw( I( = Ccam( CLVF ( Iin( (1) In a final implementation, one or more reference lines have to be integrated into the filter in order to allow measuring I raw ( and I in (x) simultaneously. This can be achieved by leaving a line within the filter uncoated such that light propagation through this uncoated line does not depend on the wavelength of light. For optimum performance, reference lines should be positioned in close proximity to the LVF line. calibration factor LVF correction Camera response Reference (a) wavelength (nm) intensity 1.2 raw data calibrated data reference measurement (b) wavelength (nm) Fig. 2: (a) Calibration factors for wavelength dependency of LVF and camera as well as correction for inhomogeneous illumination. Inset: Camera snapshot without LVF (reference). (b) Snapshot and intensity profile with LVF. The calibrated intensity profile of light distribution behind the camera yields spectrum of incident light (white LED). The spectrum is in perfect agreement with measured data from a grating based spectrometer. 3.1 LED spectroscopy In order to demonstrate the performance of the wavelength detectors experimentally we analyzed the spectrum of the white LED which is fabricated from a blue LED that was coated with a yellow phosphor layer. The LED light was first focused onto a grating based monochromator in order to measure the reference spectrum as depicted in Fig. 1(a). The monochromator was calibrated beforehand with a calibrated light source such that the wavelength dependent grating efficiency and the detector sensitivity were eliminated from the measurement. Figure 2(b) shows the spectrum of the LED after calibration. The spectrum (C) 2007 OSA 23 July 2007 / Vol. 15, No. 15 / OPTICS EXPRESS 9704
5 features a sharp peak around 460 nm from the blue pump LED and a much broader distribution centered near 570 nm which originates from the phosphorescence. Next, the LED light was collimated by using an achromatic lens to create a beam with a diameter of approximately 15 mm. The light was directed onto the chip-size wavelength detector described above. Figure 2(b) shows a snapshot taken by the camera and the intensity profile that was extracted from this image by averaging over 20 lines (this corresponds to approximately 50% of the filter width). The intensity profile was corrected by a reference profile as described above that was recorded beforehand without the LVF in place. Figure 2(a) includes the corresponding snapshot and intensity profile that was extracted as described above. The shape of the intensity profile reflects the shape of a Gaussian light spot that was created by the lens of our experimental setup. In Fig. 2(b) we compare the intensity profile before and after correcting the data with the calibration factors as well as with the spectrum received from the grating-based spectrometer. The obtained spectrum is in perfect agreement with the grating based measurement. 3.2 Spectroscopy of a moving LED In another experiment we focused the light of the white LED and moved the resulting spot across the LVF by moving the LED/lens combination with respect to the chip-size spectrometer (Fig. 1(c)). Thereby, we tested the performance of the chip-size spectrometer under a completely different light input condition than considered previously. In this scenario only a small spectral region is sampled at a time and the entire spectrum is recorded sequentially. The spectral region that is sampled is defined by the position and the size of the light spot on the LVF. Figure 3(a) shows the intensity profile that is recorded by the CCD sensor for four different spot positions. The profiles are relatively broad because of the diverging light beam between the LVF and the sensor as depicted in Fig. 1(c). Still, the intensity of the profiles can be attributed to a well-defined wavelength because the light beam sampled only a small region of the LVF. Therefore, we integrated the intensity of the profile and ascribed the entire intensity to the wavelength that is determined by the position of the light spot on the LVF. We determined this position by the peak location λ peak of a Gaussian curve that is fitted to the profile (see Fig. 3(a)). The intensity was integrated from λ peak w to λ peak +w where w is the FWHM of the Gaussian fit moving LED spectrum static LED spectrum intensity 15 intensity (a) wavelength (nm) (b) wavelength (nm) Fig. 3: (a) Sequentially recorded intensity profiles of a focused and moving LED (see Fig. 1(c)). The peak position of each curve is correlated with a spectral region that is defined by the LVF s transmission properties. The area below the curve quantifies the intensity of the corresponding spectral component. (b) Combining the spectral band and intensity information of each profile results in the spectrum of the LED. The spectrum of the moving LED is compared to the spectrum of the static experiment (before calibration). (C) 2007 OSA 23 July 2007 / Vol. 15, No. 15 / OPTICS EXPRESS 9705
6 The light spot was shifted in increments of 0.13 mm along the gradient of the LVF and the resulting intensity profiles were recorded. For a filter length of 10 mm this resulted in about 80 curves. For each profile we determined the integral and assigned it to the corresponding wavelength as described above. The resulting data are shown in Fig. 3(b) and compared to the spectrum that was obtained from the static large-area spectroscopy approach described above. Excellent agreement was achieved between the two light input schemes. The small deviations are due to systematic experimental errors. As mentioned above, the design of the CCD camera required a gap between LVF and CCD chip. In the above experiment we chose to position the focal point of the optical setup on the filter. The results would have changed dramatically if we had put the focal point onto the detector. In this case the incident light samples many positions on the LVF and it is impossible to separate the different wavelength components because the entire light intensity is detected by a single spot on the camera. Thus, the features of the spectrum would be washed out essentially because the transmission properties of the filter are averaged over a large area. On the other hand, if we place the focal point somewhere in front of the filter (see spotted line in Fig. 1(c)), we achieve a situation where we can take advantage of the divergent light beam in order to measure multiple spectral regions at once. In this case, many positions of the filter receive light at a well-defined angle that is determined by the lateral position of the focal point and the distance from the filter. If we assigned the entire intensity that is received at the CCD sensor to a single wavelength, we would again be averaging the transmission properties of many positions and angles and end up with a washed out spectrum. Fortunately, we can separate the different filter locations in this geometry, because the light that transmits at a particular location through the filter does not mix with the light from a different location. Each pixel of the CCD receives light only from a small filter region and within a small angular spectrum. 4. Conclusion Chip-size wavelength detectors were designed by combining linear variable band-pass filters with a CCD camera. The filter converts the spectral information of the incident light into a spatially dependent signal that is analyzed by the detector. The filters can be designed either to cover a broad spectral range or to enable high wavelength resolution. We have demonstrated a spectrometer for the visible spectral range and have discussed calibration and referencing techniques. Inclusion of a reference line that monitors the intensity distribution of the incoming light is essential for this kind of wavelength detector to eliminate errors from inhomogeneous illumination. In addition, it is essential to correct the measurement with regard to the angle of the incident light. Compact broad-band spectrometers enable integration of spectroscopic techniques onto lab-on-a-chip devices. Due to their extended detection area, chip-size spectrometers are especially favorable for large light-emitting areas or moving particles. We recorded the spectrum of a LED under both light-input geometries, and in both scenarios we achieved excellent agreement with a reference measurement obtained from a conventional spectrometer. Acknowledgments The authors are pleased to acknowledge helpful discussions with Noble M. Johnson (PARC) and Gottfried Döhler (Max Planck Research Group, Institute of Optics, Information and Photonics, Erlangen, Germany). The research was partly funded by ONR under grant N C-0430 monitored by Jeremy Walker, Susan Rose-Pehrsson, and Paul Armistead. (C) 2007 OSA 23 July 2007 / Vol. 15, No. 15 / OPTICS EXPRESS 9706
Measurement and alignment of linear variable filters
Measurement and alignment of linear variable filters Rob Sczupak, Markus Fredell, Tim Upton, Tom Rahmlow, Sheetal Chanda, Gregg Jarvis, Sarah Locknar, Florin Grosu, Terry Finnell and Robert Johnson Omega
More informationImproving the Collection Efficiency of Raman Scattering
PERFORMANCE Unparalleled signal-to-noise ratio with diffraction-limited spectral and imaging resolution Deep-cooled CCD with excelon sensor technology Aberration-free optical design for uniform high resolution
More informationECEN. Spectroscopy. Lab 8. copy. constituents HOMEWORK PR. Figure. 1. Layout of. of the
ECEN 4606 Lab 8 Spectroscopy SUMMARY: ROBLEM 1: Pedrotti 3 12-10. In this lab, you will design, build and test an optical spectrum analyzer and use it for both absorption and emission spectroscopy. The
More informationObservational Astronomy
Observational Astronomy Instruments The telescope- instruments combination forms a tightly coupled system: Telescope = collecting photons and forming an image Instruments = registering and analyzing the
More informationApplications of Steady-state Multichannel Spectroscopy in the Visible and NIR Spectral Region
Feature Article JY Division I nformation Optical Spectroscopy Applications of Steady-state Multichannel Spectroscopy in the Visible and NIR Spectral Region Raymond Pini, Salvatore Atzeni Abstract Multichannel
More informationExam 4. Name: Class: Date: Multiple Choice Identify the choice that best completes the statement or answers the question.
Name: Class: Date: Exam 4 Multiple Choice Identify the choice that best completes the statement or answers the question. 1. Mirages are a result of which physical phenomena a. interference c. reflection
More informationBaySpec SuperGamut OEM
BaySpec SuperGamut OEM Spectrographs & Spectrometers RUGGED SOLID STATE HIGH RESOLUTION OPTIMIZED COOLING COST EFFECTIVE HIGH THROUGHPUT www.bayspec.com Specifications Model UV-NIR VIS-NIR NIR 900-1700nm
More informationSpark Spectral Sensor Offers Advantages
04/08/2015 Spark Spectral Sensor Offers Advantages Spark is a small spectral sensor from Ocean Optics that bridges the spectral measurement gap between filter-based devices such as RGB color sensors and
More informationPhotonic-based multi-wavelength sensor for object identification
Edith Cowan University Research Online ECU Publications Pre. 2011 2010 Photonic-based multi-wavelength sensor for object identification Kavitha Venkataraayan Edith Cowan University Sreten Askraba Edith
More informationDepartment of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, 77. Table of Contents 1
Efficient single photon detection from 500 nm to 5 μm wavelength: Supporting Information F. Marsili 1, F. Bellei 1, F. Najafi 1, A. E. Dane 1, E. A. Dauler 2, R. J. Molnar 2, K. K. Berggren 1* 1 Department
More informationPerformance Comparison of Spectrometers Featuring On-Axis and Off-Axis Grating Rotation
Performance Comparison of Spectrometers Featuring On-Axis and Off-Axis Rotation By: Michael Case and Roy Grayzel, Acton Research Corporation Introduction The majority of modern spectrographs and scanning
More informationSupplementary Information for. Surface Waves. Angelo Angelini, Elsie Barakat, Peter Munzert, Luca Boarino, Natascia De Leo,
Supplementary Information for Focusing and Extraction of Light mediated by Bloch Surface Waves Angelo Angelini, Elsie Barakat, Peter Munzert, Luca Boarino, Natascia De Leo, Emanuele Enrico, Fabrizio Giorgis,
More informationA novel tunable diode laser using volume holographic gratings
A novel tunable diode laser using volume holographic gratings Christophe Moser *, Lawrence Ho and Frank Havermeyer Ondax, Inc. 85 E. Duarte Road, Monrovia, CA 9116, USA ABSTRACT We have developed a self-aligned
More informationPhotonic-based spectral reflectance sensor for ground-based plant detection and weed discrimination
Research Online ECU Publications Pre. 211 28 Photonic-based spectral reflectance sensor for ground-based plant detection and weed discrimination Arie Paap Sreten Askraba Kamal Alameh John Rowe 1.1364/OE.16.151
More informationExamination, TEN1, in courses SK2500/SK2501, Physics of Biomedical Microscopy,
KTH Applied Physics Examination, TEN1, in courses SK2500/SK2501, Physics of Biomedical Microscopy, 2009-06-05, 8-13, FB51 Allowed aids: Compendium Imaging Physics (handed out) Compendium Light Microscopy
More informationIntroduction to the operating principles of the HyperFine spectrometer
Introduction to the operating principles of the HyperFine spectrometer LightMachinery Inc., 80 Colonnade Road North, Ottawa ON Canada A spectrometer is an optical instrument designed to split light into
More informationWavelength Stabilization of HPDL Array Fast-Axis Collimation Optic with integrated VHG
Wavelength Stabilization of HPDL Array Fast-Axis Collimation Optic with integrated VHG C. Schnitzler a, S. Hambuecker a, O. Ruebenach a, V. Sinhoff a, G. Steckman b, L. West b, C. Wessling c, D. Hoffmann
More informationComponents of Optical Instruments. Chapter 7_III UV, Visible and IR Instruments
Components of Optical Instruments Chapter 7_III UV, Visible and IR Instruments 1 Grating Monochromators Principle of operation: Diffraction Diffraction sources: grooves on a reflecting surface Fabrication:
More informationMulti-wavelength laser scanning architecture for object discrimination.
Research Online ECU Publications Pre. 211 21 Multi-wavelength laser scanning architecture for object discrimination. Kavitha Venkataraayan Sreten Askraba Kamal Alameh Clifton Smith 1.119/HONET.21.5715772
More informationMicroscopic Structures
Microscopic Structures Image Analysis Metal, 3D Image (Red-Green) The microscopic methods range from dark field / bright field microscopy through polarisation- and inverse microscopy to techniques like
More informationInstructions for the Experiment
Instructions for the Experiment Excitonic States in Atomically Thin Semiconductors 1. Introduction Alongside with electrical measurements, optical measurements are an indispensable tool for the study of
More informationMASSACHUSETTS INSTITUTE OF TECHNOLOGY Department of Electrical Engineering and Computer Science
Student Name Date MASSACHUSETTS INSTITUTE OF TECHNOLOGY Department of Electrical Engineering and Computer Science 6.161 Modern Optics Project Laboratory Laboratory Exercise No. 6 Fall 2010 Solid-State
More informationHigh-power semiconductor lasers for applications requiring GHz linewidth source
High-power semiconductor lasers for applications requiring GHz linewidth source Ivan Divliansky* a, Vadim Smirnov b, George Venus a, Alex Gourevitch a, Leonid Glebov a a CREOL/The College of Optics and
More informationThe FTNIR Myths... Misinformation or Truth
The FTNIR Myths... Misinformation or Truth Recently we have heard from potential customers that they have been told that FTNIR instruments are inferior to dispersive or monochromator based NIR instruments.
More informationCHIRPED FIBER BRAGG GRATING (CFBG) BY ETCHING TECHNIQUE FOR SIMULTANEOUS TEMPERATURE AND REFRACTIVE INDEX SENSING
CHIRPED FIBER BRAGG GRATING (CFBG) BY ETCHING TECHNIQUE FOR SIMULTANEOUS TEMPERATURE AND REFRACTIVE INDEX SENSING Siti Aisyah bt. Ibrahim and Chong Wu Yi Photonics Research Center Department of Physics,
More informationVixar High Power Array Technology
Vixar High Power Array Technology I. Introduction VCSELs arrays emitting power ranging from 50mW to 10W have emerged as an important technology for applications within the consumer, industrial, automotive
More informationMode analysis of Oxide-Confined VCSELs using near-far field approaches
Annual report 998, Dept. of Optoelectronics, University of Ulm Mode analysis of Oxide-Confined VCSELs using near-far field approaches Safwat William Zaki Mahmoud We analyze the transverse mode structure
More informationSection 1: SPECTRAL PRODUCTS
Section 1: Optical Non-dispersive Wavelength Selection Filter Based Filter Filter Fundamentals Filter at an Incidence Angle Filters and Environmental Conditions Dispersive Instruments Grating and Polychromators
More informationSpectroscopy of Ruby Fluorescence Physics Advanced Physics Lab - Summer 2018 Don Heiman, Northeastern University, 1/12/2018
1 Spectroscopy of Ruby Fluorescence Physics 3600 - Advanced Physics Lab - Summer 2018 Don Heiman, Northeastern University, 1/12/2018 I. INTRODUCTION The laser was invented in May 1960 by Theodor Maiman.
More informationOptical Coherence: Recreation of the Experiment of Thompson and Wolf
Optical Coherence: Recreation of the Experiment of Thompson and Wolf David Collins Senior project Department of Physics, California Polytechnic State University San Luis Obispo June 2010 Abstract The purpose
More informationOptical In-line Control of Web Coating Processes
AIMCAL Europe 2012 Peter Lamparter Web Coating Conference Carl Zeiss MicroImaging GmbH 11-13 June / Prague, Czech Republic Carl-Zeiss-Promenade 10 07745 Jena, Germany p.lamparter@zeiss.de +49 3641 642221
More informationParallel scan spectral surface plasmon resonance imaging
Parallel scan spectral surface plasmon resonance imaging Le Liu,* Yonghong He, Ying Zhang, Suihua Ma, Hui Ma, and Jihua Guo Laboratory of Optical Imaging and Sensing, Graduate School at Shenzhen, Tsinghua
More informationPROCEEDINGS OF SPIE. Measuring and teaching light spectrum using Tracker as a spectrometer. M. Rodrigues, M. B. Marques, P.
PROCEEDINGS OF SPIE SPIEDigitalLibrary.org/conference-proceedings-of-spie Measuring and teaching light spectrum using Tracker as a spectrometer M. Rodrigues, M. B. Marques, P. Simeão Carvalho M. Rodrigues,
More informationDevelopment of a new multi-wavelength confocal surface profilometer for in-situ automatic optical inspection (AOI)
Development of a new multi-wavelength confocal surface profilometer for in-situ automatic optical inspection (AOI) Liang-Chia Chen 1#, Chao-Nan Chen 1 and Yi-Wei Chang 1 1. Institute of Automation Technology,
More informationSPECTRAL SCANNER. Recycling
SPECTRAL SCANNER The Spectral Scanner, produced on an original project of DV s.r.l., is an instrument to acquire with extreme simplicity the spectral distribution of the different wavelengths (spectral
More informationChapter 17: Wave Optics. What is Light? The Models of Light 1/11/13
Chapter 17: Wave Optics Key Terms Wave model Ray model Diffraction Refraction Fringe spacing Diffraction grating Thin-film interference What is Light? Light is the chameleon of the physical world. Under
More informationOption G 4:Diffraction
Name: Date: Option G 4:Diffraction 1. This question is about optical resolution. The two point sources shown in the diagram below (not to scale) emit light of the same frequency. The light is incident
More informationFRAUNHOFER AND FRESNEL DIFFRACTION IN ONE DIMENSION
FRAUNHOFER AND FRESNEL DIFFRACTION IN ONE DIMENSION Revised November 15, 2017 INTRODUCTION The simplest and most commonly described examples of diffraction and interference from two-dimensional apertures
More informationHR2000+ Spectrometer. User-Configured for Flexibility. now with. Spectrometers
Spectrometers HR2000+ Spectrometer User-Configured for Flexibility HR2000+ One of our most popular items, the HR2000+ Spectrometer features a high-resolution optical bench, a powerful 2-MHz analog-to-digital
More informationSensitive measurement of partial coherence using a pinhole array
1.3 Sensitive measurement of partial coherence using a pinhole array Paul Petruck 1, Rainer Riesenberg 1, Richard Kowarschik 2 1 Institute of Photonic Technology, Albert-Einstein-Strasse 9, 07747 Jena,
More informationInstruction manual and data sheet ipca h
1/15 instruction manual ipca-21-05-1000-800-h Instruction manual and data sheet ipca-21-05-1000-800-h Broad area interdigital photoconductive THz antenna with microlens array and hyperhemispherical silicon
More informationPHYS General Physics II Lab Diffraction Grating
1 PHYS 1040 - General Physics II Lab Diffraction Grating In this lab you will perform an experiment to understand the interference of light waves when they pass through a diffraction grating and to determine
More informationSupplementary Materials
Supplementary Materials In the supplementary materials of this paper we discuss some practical consideration for alignment of optical components to help unexperienced users to achieve a high performance
More informationA broadband achromatic metalens for focusing and imaging in the visible
SUPPLEMENTARY INFORMATION Articles https://doi.org/10.1038/s41565-017-0034-6 In the format provided by the authors and unedited. A broadband achromatic metalens for focusing and imaging in the visible
More informationEE119 Introduction to Optical Engineering Spring 2003 Final Exam. Name:
EE119 Introduction to Optical Engineering Spring 2003 Final Exam Name: SID: CLOSED BOOK. THREE 8 1/2 X 11 SHEETS OF NOTES, AND SCIENTIFIC POCKET CALCULATOR PERMITTED. TIME ALLOTTED: 180 MINUTES Fundamental
More informationLaser Beam Analysis Using Image Processing
Journal of Computer Science 2 (): 09-3, 2006 ISSN 549-3636 Science Publications, 2006 Laser Beam Analysis Using Image Processing Yas A. Alsultanny Computer Science Department, Amman Arab University for
More informationMultispectral Image Capturing System Based on a Micro Mirror Device with a Diffraction Grating
Multispectral Image Capturing System Based on a Micro Mirror Device with a Diffraction Grating M. Flaspöhler, S. Buschnakowski, M. Kuhn, C. Kaufmann, J. Frühauf, T. Gessner, G. Ebest, and A. Hübler Chemnitz
More informationMaya2000 Pro Spectrometer
now with triggering! Maya2000 Pro Our Maya2000 Pro Spectrometer offers you the perfect solution for applications that demand low light-level, UV-sensitive operation. This back-thinned, 2D FFT-CCD, uncooled
More informationApplying of refractive beam shapers of circular symmetry to generate non-circular shapes of homogenized laser beams
- 1 - Applying of refractive beam shapers of circular symmetry to generate non-circular shapes of homogenized laser beams Alexander Laskin a, Vadim Laskin b a MolTech GmbH, Rudower Chaussee 29-31, 12489
More informationWaveguiding in PMMA photonic crystals
ROMANIAN JOURNAL OF INFORMATION SCIENCE AND TECHNOLOGY Volume 12, Number 3, 2009, 308 316 Waveguiding in PMMA photonic crystals Daniela DRAGOMAN 1, Adrian DINESCU 2, Raluca MÜLLER2, Cristian KUSKO 2, Alex.
More informationAdd CLUE to your SEM. High-efficiency CL signal-collection. Designed for your SEM and application. Maintains original SEM functionality
Add CLUE to your SEM Designed for your SEM and application The CLUE family offers dedicated CL systems for imaging and spectroscopic analysis suitable for most SEMs. In addition, when combined with other
More informationThermo Scientific icap 7000 Plus Series ICP-OES: Innovative ICP-OES optical design
TECHNICAL NOTE 43333 Thermo Scientific icap 7000 Plus Series ICP-OES: Innovative ICP-OES optical design Keywords Optical design, Polychromator, Spectrometer Key Benefits The Thermo Scientific icap 7000
More informationChemistry 524--"Hour Exam"--Keiderling Mar. 19, pm SES
Chemistry 524--"Hour Exam"--Keiderling Mar. 19, 2013 -- 2-4 pm -- 170 SES Please answer all questions in the answer book provided. Calculators, rulers, pens and pencils permitted. No open books allowed.
More informationOCT Spectrometer Design Understanding roll-off to achieve the clearest images
OCT Spectrometer Design Understanding roll-off to achieve the clearest images Building a high-performance spectrometer for OCT imaging requires a deep understanding of the finer points of both OCT theory
More informationAIXUV's Tools for EUV-Reflectometry Rainer Lebert, Christian Wies AIXUV GmbH, Steinbachstrasse 15, D Aachen, Germany
AIXUV's Tools for EUV-Reflectometry Rainer Lebert, Christian Wies, Steinbachstrasse 5, D-, Germany and partners developed several tools for EUV-reflectometry in different designs for various types of applications.
More informationPowerful DMD-based light sources with a high throughput virtual slit Arsen R. Hajian* a, Ed Gooding a, Thomas Gunn a, Steven Bradbury a
Powerful DMD-based light sources with a high throughput virtual slit Arsen R. Hajian* a, Ed Gooding a, Thomas Gunn a, Steven Bradbury a a Hindsight Imaging Inc., 233 Harvard St. #316, Brookline MA 02446
More informationSupplementary Figure 1. Effect of the spacer thickness on the resonance properties of the gold and silver metasurface layers.
Supplementary Figure 1. Effect of the spacer thickness on the resonance properties of the gold and silver metasurface layers. Finite-difference time-domain calculations of the optical transmittance through
More informationplasmonic nanoblock pair
Nanostructured potential of optical trapping using a plasmonic nanoblock pair Yoshito Tanaka, Shogo Kaneda and Keiji Sasaki* Research Institute for Electronic Science, Hokkaido University, Sapporo 1-2,
More informationAngela Piegari ENEA, Optical Coatings Laboratory, Roma, Italy
Optical Filters for Space Instrumentation Angela Piegari ENEA, Optical Coatings Laboratory, Roma, Italy Trieste, 18 February 2015 Optical coatings for Space Instrumentation Spectrometers, imagers, interferometers,
More informationDesign Description Document
UNIVERSITY OF ROCHESTER Design Description Document Flat Output Backlit Strobe Dare Bodington, Changchen Chen, Nick Cirucci Customer: Engineers: Advisor committee: Sydor Instruments Dare Bodington, Changchen
More informationNanonics Systems are the Only SPMs that Allow for On-line Integration with Standard MicroRaman Geometries
Nanonics Systems are the Only SPMs that Allow for On-line Integration with Standard MicroRaman Geometries 2002 Photonics Circle of Excellence Award PLC Ltd, England, a premier provider of Raman microspectral
More informationEXPERIMENTAL OBSERVATIONS OF THE LASER KEYHOLE WELDING PROCESS OF AA
EXPERIMENTAL OBSERVATIONS OF THE LASER KEYHOLE WELDING PROCESS OF AA5182 1801 B.J. Aalderink 1, R.G.K.M. Aarts 2, J.B. Jonker 2 and J. Meijer 2 1 Netherlands Institute for Metals Research P.O. Box 217,
More informationQE65000 Spectrometer. Scientific-Grade Spectroscopy in a Small Footprint. now with. Spectrometers
QE65000 Spectrometer Scientific-Grade Spectroscopy in a Small Footprint QE65000 The QE65000 Spectrometer is the most sensitive spectrometer we ve developed. Its Hamamatsu FFT-CCD detector provides 90%
More informationUniversity of Wisconsin Chemistry 524 Spectroscopic Components *
University of Wisconsin Chemistry 524 Spectroscopic Components * In journal articles, presentations, and textbooks, chemical instruments are often represented as block diagrams. These block diagrams highlight
More informationLight, Color, Spectra 05/30/2006. Lecture 17 1
What do we see? Light Our eyes can t t detect intrinsic light from objects (mostly infrared), unless they get red hot The light we see is from the sun or from artificial light When we see objects, we see
More informationCHAPTER 7. Components of Optical Instruments
CHAPTER 7 Components of Optical Instruments From: Principles of Instrumental Analysis, 6 th Edition, Holler, Skoog and Crouch. CMY 383 Dr Tim Laurens NB Optical in this case refers not only to the visible
More informationDynamic Phase-Shifting Microscopy Tracks Living Cells
from photonics.com: 04/01/2012 http://www.photonics.com/article.aspx?aid=50654 Dynamic Phase-Shifting Microscopy Tracks Living Cells Dr. Katherine Creath, Goldie Goldstein and Mike Zecchino, 4D Technology
More informationCHAPTER 9 POSITION SENSITIVE PHOTOMULTIPLIER TUBES
CHAPTER 9 POSITION SENSITIVE PHOTOMULTIPLIER TUBES The current multiplication mechanism offered by dynodes makes photomultiplier tubes ideal for low-light-level measurement. As explained earlier, there
More informationTriVista. Universal Raman Solution
TriVista Universal Raman Solution Why choose the Princeton Instruments/Acton TriVista? Overview Raman Spectroscopy systems can be derived from several dispersive components depending on the level of performance
More informationSpectral and Polarization Configuration Guide for MS Series 3-CCD Cameras
Spectral and Polarization Configuration Guide for MS Series 3-CCD Cameras Geospatial Systems, Inc (GSI) MS 3100/4100 Series 3-CCD cameras utilize a color-separating prism to split broadband light entering
More informationHolography as a tool for advanced learning of optics and photonics
Holography as a tool for advanced learning of optics and photonics Victor V. Dyomin, Igor G. Polovtsev, Alexey S. Olshukov Tomsk State University 36 Lenin Avenue, Tomsk, 634050, Russia Tel/fax: 7 3822
More informationA Novel Multipass Optical System Oleg Matveev University of Florida, Department of Chemistry, Gainesville, Fl
A Novel Multipass Optical System Oleg Matveev University of Florida, Department of Chemistry, Gainesville, Fl BACKGROUND Multipass optical systems (MOS) are broadly used in absorption, Raman, fluorescence,
More informationBeam Profiling. Introduction. What is Beam Profiling? by Michael Scaggs. Haas Laser Technologies, Inc.
Beam Profiling by Michael Scaggs Haas Laser Technologies, Inc. Introduction Lasers are ubiquitous in industry today. Carbon Dioxide, Nd:YAG, Excimer and Fiber lasers are used in many industries and a myriad
More informationFabrication of a high-resolution smartphone spectrometer for. education using a 3D printer
Fabrication of a high-resolution smartphone spectrometer for education using a 3D printer Yura Woo and Young-Gu Ju Department of Physics Education, Kyungpook National University, 80 Daehakro, Bukgu, Daegu,
More informationSpherical Beam Volume Holograms Recorded in Reflection Geometry for Diffuse Source Spectroscopy
Spherical Beam Volume Holograms Recorded in Reflection Geometry for Diffuse Source Spectroscopy Sundeep Jolly A Proposal Presented to the Academic Faculty in Partial Fulfillment of the Requirements for
More informationObserving a colour and a spectrum of light mixed by a digital projector
Observing a colour and a spectrum of light mixed by a digital projector Zdeněk Navrátil Abstract In this paper an experiment studying a colour and a spectrum of light produced by a digital projector is
More informationBasic Components of Spectroscopic. Instrumentation
Basic Components of Spectroscopic Ahmad Aqel Ifseisi Assistant Professor of Analytical Chemistry College of Science, Department of Chemistry King Saud University P.O. Box 2455 Riyadh 11451 Saudi Arabia
More informationChapter Wave Optics. MockTime.com. Ans: (d)
Chapter Wave Optics Q1. Which one of the following phenomena is not explained by Huygen s construction of wave front? [1988] (a) Refraction Reflection Diffraction Origin of spectra Q2. Which of the following
More informationFast Laser Raman Microscope RAMAN
Fast Laser Raman Microscope RAMAN - 11 www.nanophoton.jp Fast Raman Imaging A New Generation of Raman Microscope RAMAN-11 developed by Nanophoton was created by combining confocal laser microscope technology
More informationSpectroscopy in the UV and Visible: Instrumentation. Spectroscopy in the UV and Visible: Instrumentation
Spectroscopy in the UV and Visible: Instrumentation Typical UV-VIS instrument 1 Source - Disperser Sample (Blank) Detector Readout Monitor the relative response of the sample signal to the blank Transmittance
More informationPresented by Jerry Hubbell Lake of the Woods Observatory (MPC I24) President, Rappahannock Astronomy Club
Presented by Jerry Hubbell Lake of the Woods Observatory (MPC I24) President, Rappahannock Astronomy Club ENGINEERING A FIBER-FED FED SPECTROMETER FOR ASTRONOMICAL USE Objectives Discuss the engineering
More informationNanoSpective, Inc Progress Drive Suite 137 Orlando, Florida
TEM Techniques Summary The TEM is an analytical instrument in which a thin membrane (typically < 100nm) is placed in the path of an energetic and highly coherent beam of electrons. Typical operating voltages
More informationExperimental Analysis of Luminescence in Printed Materials
Experimental Analysis of Luminescence in Printed Materials A. D. McGrath, S. M. Vaezi-Nejad Abstract - This paper is based on a printing industry research project nearing completion [1]. While luminescent
More informationMicro-Optic Solar Concentration and Next-Generation Prototypes
Micro-Optic Solar Concentration and Next-Generation Prototypes Jason H. Karp, Eric J. Tremblay and Joseph E. Ford Photonics Systems Integration Lab University of California San Diego Jacobs School of Engineering
More informationImproved Spectra with a Schmidt-Czerny-Turner Spectrograph
Improved Spectra with a Schmidt-Czerny-Turner Spectrograph Abstract For years spectra have been measured using traditional Czerny-Turner (CT) design dispersive spectrographs. Optical aberrations inherent
More informationWhere Image Quality Begins
Where Image Quality Begins Filters are a Necessity Not an Accessory Inexpensive Insurance Policy for the System The most cost effective way to improve repeatability and stability in any machine vision
More informationAPPLICATIONS FOR TELECENTRIC LIGHTING
APPLICATIONS FOR TELECENTRIC LIGHTING Telecentric lenses used in combination with telecentric lighting provide the most accurate results for measurement of object shapes and geometries. They make attributes
More informationAdministrative details:
Administrative details: Anything from your side? www.photonics.ethz.ch 1 What are we actually doing here? Optical imaging: Focusing by a lens Angular spectrum Paraxial approximation Gaussian beams Method
More informationEXPRIMENT 3 COUPLING FIBERS TO SEMICONDUCTOR SOURCES
EXPRIMENT 3 COUPLING FIBERS TO SEMICONDUCTOR SOURCES OBJECTIVES In this lab, firstly you will learn to couple semiconductor sources, i.e., lightemitting diodes (LED's), to optical fibers. The coupling
More informationDesign of Laser Multi-beam Generator for Plant Discrimination
esearch Online ECU Publications 211 211 Design of Laser Multi-beam Generator for Plant Discrimination Sreten Askraba Arie Paap Kamal Alameh John owe 1.119/HONET.211.6149781 This article was originally
More informationThe Wave Nature of Light
The Wave Nature of Light Physics 102 Lecture 7 4 April 2002 Pick up Grating & Foil & Pin 4 Apr 2002 Physics 102 Lecture 7 1 Light acts like a wave! Last week we saw that light travels from place to place
More informationChapter 36: diffraction
Chapter 36: diffraction Fresnel and Fraunhofer diffraction Diffraction from a single slit Intensity in the single slit pattern Multiple slits The Diffraction grating X-ray diffraction Circular apertures
More informationBetter Imaging with a Schmidt-Czerny-Turner Spectrograph
Better Imaging with a Schmidt-Czerny-Turner Spectrograph Abstract For years, images have been measured using Czerny-Turner (CT) design dispersive spectrographs. Optical aberrations inherent in the CT design
More informationLaser Speckle Reducer LSR-3000 Series
Datasheet: LSR-3000 Series Update: 06.08.2012 Copyright 2012 Optotune Laser Speckle Reducer LSR-3000 Series Speckle noise from a laser-based system is reduced by dynamically diffusing the laser beam. A
More informationEE119 Introduction to Optical Engineering Fall 2009 Final Exam. Name:
EE119 Introduction to Optical Engineering Fall 2009 Final Exam Name: SID: CLOSED BOOK. THREE 8 1/2 X 11 SHEETS OF NOTES, AND SCIENTIFIC POCKET CALCULATOR PERMITTED. TIME ALLOTTED: 180 MINUTES Fundamental
More informationBEAM SHAPING OPTICS TO IMPROVE HOLOGRAPHIC AND INTERFEROMETRIC NANOMANUFACTURING TECHNIQUES Paper N405 ABSTRACT
BEAM SHAPING OPTICS TO IMPROVE HOLOGRAPHIC AND INTERFEROMETRIC NANOMANUFACTURING TECHNIQUES Paper N5 Alexander Laskin, Vadim Laskin AdlOptica GmbH, Rudower Chaussee 9, 89 Berlin, Germany ABSTRACT Abstract
More informationAutomated Spectrophotometric Spatial Profiling of Coated Optical Wafers
Automated Spectrophotometric Spatial Profiling of Coated Optical Wafers Application note Materials testing and research Authors Travis Burt Fabian Zieschang Agilent Technologies, Inc. Parts of this work
More informationCONFIGURING. Your Spectroscopy System For PEAK PERFORMANCE. A guide to selecting the best Spectrometers, Sources, and Detectors for your application
CONFIGURING Your Spectroscopy System For PEAK PERFORMANCE A guide to selecting the best Spectrometers, s, and s for your application Spectral Measurement System Spectral Measurement System Spectrograph
More informationTIME-PRESERVING MONOCHROMATORS FOR ULTRASHORT EXTREME-ULTRAVIOLET PULSES
TIME-PRESERVING MONOCHROMATORS FOR ULTRASHORT EXTREME-ULTRAVIOLET PULSES Luca Poletto CNR - Institute of Photonics and Nanotechnologies Laboratory for UV and X-Ray Optical Research Padova, Italy e-mail:
More informationSpectral Transmission Measurements on various Astronomical Filters.
Spectral Transmission Measurements on various Astronomical Filters. Andreas Bartels - June 2008 Thanks to my friend Olivier, who provided the Spectrometer, I was able to do some spectral transmission measurements
More information